2017
DOI: 10.1002/qre.2203
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An adaptive EWMA scheme‐based CUSUM accumulation error for efficient monitoring of process location

Abstract: The examination of product characteristics using a statistical tool is an important step in a manufacturing environment to ensure product quality. Several methods are employed for maintaining product quality assurance. Quality control charts, which utilize statistical methods, are normally used to detect special causes. Shewhart control charts are popular; their only limitation is that they are effective in handling only large shifts. For handling small shifts, the cumulative sum (CUSUM) and the exponential we… Show more

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Cited by 26 publications
(30 citation statements)
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“…The time‐varying upper control limit (UCL) and lower control limit (LCL) for the proposed schemes AEWMAT, AEWMAJ, and AEWMAV as follows: trueitalicUCLi=μFn+LFσFnλ()2λ1()1λ2iitalicLCLi=μFnLFσFnλ()2λ1()1λ2i, where L F represents L T , L J , or L V , the control limits multiplier based on either AEWMAT, AEWMAJ, and AEWMAV scheme, respectively, and whose value depends on the choice of smoothing constant λ for prespecified false alarm rate. The choice of λ against w ( e i ) is preferred here, because w ( e i ) delays the detection ability of the proposed scheme as demonstrated by Zaman et al The statistics μ F ( n ) and σ F ( n ) represent either μ T ( n ) and σ T ( n ) of AEWMAT, μ J ( n ) and σ J ( n ) of AEWMAJ, or μ V ( n ) and σ V ( n ) of AEWMAV.…”
Section: Related Literature Transformations and Design Structure Ofmentioning
confidence: 99%
“…The time‐varying upper control limit (UCL) and lower control limit (LCL) for the proposed schemes AEWMAT, AEWMAJ, and AEWMAV as follows: trueitalicUCLi=μFn+LFσFnλ()2λ1()1λ2iitalicLCLi=μFnLFσFnλ()2λ1()1λ2i, where L F represents L T , L J , or L V , the control limits multiplier based on either AEWMAT, AEWMAJ, and AEWMAV scheme, respectively, and whose value depends on the choice of smoothing constant λ for prespecified false alarm rate. The choice of λ against w ( e i ) is preferred here, because w ( e i ) delays the detection ability of the proposed scheme as demonstrated by Zaman et al The statistics μ F ( n ) and σ F ( n ) represent either μ T ( n ) and σ T ( n ) of AEWMAT, μ J ( n ) and σ J ( n ) of AEWMAJ, or μ V ( n ) and σ V ( n ) of AEWMAV.…”
Section: Related Literature Transformations and Design Structure Ofmentioning
confidence: 99%
“…A comprehensive literature review on adaptive control charts can be studies in Psarakis 21 work. The AEWMA C (AEWMAfalse(1false)C0.28emand0.28emAEWMAfalse(2false)C) control charts based classical CUSUM control chart accumulation error for efficient monitoring of process location shift proposed by Zaman et al 22 . More details about recent development in control charts with new techniques can be studied in Bilal et al., 23 Shafqat et al., 24 Naveed et al., 25 Shah et al., 26 Ali et al., 27 and references therein.…”
Section: Introductionmentioning
confidence: 99%
“…Due to the remarkable adaptability of this AEWMA scheme, it has been investigated by several researchers, see, for instance, Refs. [4–12].…”
Section: Introductionmentioning
confidence: 99%