An AFM, XPS and wettability study of the surface heterogeneity of PS/PMMA-r-PMAA demixed thin films

Wettability of the morphologically and compositionally varied surfaces prepared from blends of well ordered comb-like polymer and polystyrene

“…The bottom layer remained even when the blend films were immersed and shaken in benzene for several minutes. It has also been reported that the bottom part of the blends are the polymer layers with better solubility in the solvent for the blend solution [44][45][46][47]50]. In the present case, CH 3 -10SE has better solubility than PS in CHCl 3 , which is the solvent of the preparation of these blends.…”

“…When the CH 3 -10SE content was >40 wt.%, contact angles and surface energies of all blends are even closer to that of pure CH 3 -10SE. It was also reported that the contact angles and surface energies of the polymer blends are controlled by components with lower surface energy [50,51]. The slightly lower surface energies (or slightly larger contact angles) of the 40/60, 60/40, and 80/20 blends than that of pure CH 3 -10SE were attributed to the increase in surface Table 1.…”

Comb-like polymer blends of poly(oxyethylene)s with CH3-terminated and CF3-terminated alkylsulfonylmethyl side chains: Effect of terminal CF3 moiety on the surface properties of the blends

“…Other researchers reported that the contact angles of polymer systems could be governed by the low-energy phase, although it is difficult to predict the contact angles precisely, due to the complexity of the phase-separated morphologies and other factors [52,53]. The critical surface energy calculated from the contact angle of CF 3 -10SE using the hydrocarbon solvents (18.17 mN m À1 ) by the Zisman method was found to be lower than that of CH 3 -10SE (20.23 mN m À1 ) ( Table 2).…”

The correlation of stoichiometry between boron-rich LaB6 targets and LaB6 films

“…Here acquisition parameters and sensitivity factors provided by the instrument manufacturer were employed [22]. Linear, Shirley and Tougaard background subtraction were common methods for correcting and adjusting measured spectral lines, which were used for inelasticity scattered electron background, and determining peak area [23].…”

“…The values of surface roughness and distributions of surface height were calculated using the AFM images. The proportion of the surface occupied by inclusions was determined using the "Bearing analysis" function of the NanoScope Analysis software [22]. Bearing analysis provided a method of plotting and analyzing the distribution of surface height/depth over a sample.…”