2011
DOI: 10.1109/ted.2011.2163719
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An Analytical Model for Line-Edge Roughness Limited Mobility of Graphene Nanoribbons

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Cited by 34 publications
(24 citation statements)
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“…In particular, even though the conductance oscillation is similarly observed in both cases, the effect in the metallic systems (see Fig.4b for the perfect edge case) is relatively weaker than the one observed in the semiconducting GNRs (see Fig.2a for θ B = 30 • ). Next, the effects of edge disorder, which are practically inevitable and known to degrade strongly the transport properties of GNRs [68][69][70][71][72][73][74][75][76][77][78], have to be evaluated. In this work, disorder is modeled (see the details in [63]) either by a Gaussian autocorrelation function (presented in Fig.4) or by randomly removing the edge atoms.…”
mentioning
confidence: 99%
“…In particular, even though the conductance oscillation is similarly observed in both cases, the effect in the metallic systems (see Fig.4b for the perfect edge case) is relatively weaker than the one observed in the semiconducting GNRs (see Fig.2a for θ B = 30 • ). Next, the effects of edge disorder, which are practically inevitable and known to degrade strongly the transport properties of GNRs [68][69][70][71][72][73][74][75][76][77][78], have to be evaluated. In this work, disorder is modeled (see the details in [63]) either by a Gaussian autocorrelation function (presented in Fig.4) or by randomly removing the edge atoms.…”
mentioning
confidence: 99%
“…For example, the GNR width (W GNR ) and gate voltage, (V G ) are mostly studied in the range of 10-150 nm and 10-50 V, respectively [48][49][50]. Therefore, we have validated the accuracy of our developed analytical model against the device-level atomistic numerical simulation based on NEGF formalism as described for ideal GNR FET in [22] and for GNR FET with line-edge roughness in [46]. Figure 6a,b shows the I DS -V GS characteristic of GNR FETs with three different GNR indices of N = 6, 12 and 18 for drain voltages of 0.1 V and 0.5 V, respectively.…”
Section: Model Validationmentioning
confidence: 93%
“…The edge disorder has been analytically modeled by Anderson distribution in [43] assuming that atoms at the edges are randomly removed with uniform probability, such that the correlation between edge disorders has been neglected. As line-edge roughness is a statistical phenomenon, a more realistic model needs an autocorrelation function as have been already used for modeling Si/SiO 2 interface roughness [44] and the line-edge roughness in GNRs [45,46]. In this paper, we consider an exponential spatial autocorrelation function as follows:…”
Section: Non-ballistic Transportmentioning
confidence: 99%
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“…It is important to note that a strong resistivity suppression has not been reported in earlier publications on edgeroughness scattering in graphene ribbons. 23,27,28,30,63 . Our simulation results indicate that this effect only shows up when we calculate the relaxation times selfconsistently, considering a subband-quantized ribbon spectrum and a finite edge-roughness correlation length.…”
Section: Transportmentioning
confidence: 99%