ICMMT'98. 1998 International Conference on Microwave and Millimeter Wave Technology. Proceedings (Cat. No.98EX106)
DOI: 10.1109/icmmt.1998.768471
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An approximate analysis of microstrip lines with finite metallization thickness and conductivity by method of lines

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Cited by 6 publications
(5 citation statements)
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“…The advantage of this method is its great ease of implementation and speed of execution mainly due to the systematic use of a fast Fourier transform in modes. So the behavior of a single or multilayer structure can be summarized by boundary conditions expressed at the global interface [1] [2] [3] [4]. These methods need to be improved and require updates as the evolution of these circuits is very fast.…”
Section: Introductionmentioning
confidence: 99%
“…The advantage of this method is its great ease of implementation and speed of execution mainly due to the systematic use of a fast Fourier transform in modes. So the behavior of a single or multilayer structure can be summarized by boundary conditions expressed at the global interface [1] [2] [3] [4]. These methods need to be improved and require updates as the evolution of these circuits is very fast.…”
Section: Introductionmentioning
confidence: 99%
“…This simplifying assumption decreases the accuracy of the results of analytical methods used for the characterization of these structures. Several methods were used to characterize the influence of the thickness of the conductor used, such as mode-matching method [5], method of lines [6], spectral domain method [7] and conformal mapping method [8]. For the study of structures with flat and thick conductors such as micro strip line in this document, we have taken the first model proposed in [6].…”
Section: Introductionmentioning
confidence: 99%
“…Several methods were used to characterize the influence of the thickness of the conductor used, such as mode-matching method [5], method of lines [6], spectral domain method [7] and conformal mapping method [8]. For the study of structures with flat and thick conductors such as micro strip line in this document, we have taken the first model proposed in [6]. A new formulation of the iterative method FWCIP (Fast Wave Concept Iterative Process) was made to extend the study of planar structures with thick flat conductor.…”
Section: Introductionmentioning
confidence: 99%
“…This simplifying assumption decreases the accuracy of the results of analytical methods used for the characterization of these structures. Several methods were used to characterize the influence of the thickness of the conductor used, such as mode-matching method [5], method of lines [6], spectral domain method [7] and conformal mapping method [8].…”
Section: Introductionmentioning
confidence: 99%
“…For the study of structures with flat and thick conductors such as micro strip line in this document, we have taken the first model proposed in [6]. A new formulation of the iterative method FWCIP (Fast Wave Concept Iterative Process) was made to extend the study of planar structures with thick flat conductor.…”
Section: Introductionmentioning
confidence: 99%