Stripe extraction is a deciding factor in the multi-line structured light systems. This paper introduces a method to extract the deteriorated stripes in a robust and accurate way. Based on the photoelectron crosstalk phenomenon of image sensors, mathematical expression of the ideal cross-section distribution for the captured stripes is deduced. Then, we establish a probability model for each pixel, with the consideration of how well the local distribution fits the ideal distribution, and how possible it is linked with the previous stripe centers. Therefore, the extraction process is transformed into a local searching scheme with dynamic update. Experimental results show that the robustness of the proposed scheme outperforms other methods. The root mean squared error of the reconstructed point cloud is 0.219mm, which proves the validity of the proposed method.