2020
DOI: 10.1002/anie.202007353
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An Efficient and Stable Perovskite Solar Cell with Suppressed Defects by Employing Dithizone as a Lead Indicator

Abstract: The defects in perovskite films are one of the most non-negligible factors that can attenuate the performances of perovskite solar cell. This work fabricates defect-reduced perovskite film by using the lead indicator (dithizone) as an additive of perovskite functional layer. The dithizone can retard the crystallization rate of perovskite films, passivate the defects, and enhance the structure stability of perovskite by coordinating with lead atoms. As a result, the device doped with dithizone yields outstandin… Show more

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Cited by 44 publications
(22 citation statements)
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“…To measure the trap density of the perovskite films, space charge limited current (SCLC) test is conducted on a device composed of FTO/SnO 2 /perovskite/PCBM/Au. The trap-filled limit voltage (V TFL ) is acquired through the intersection voltage of ohmic and trap-filled limit region, and the trap-state density (N traps ) can be determined by the following equation: [65,66] N traps = 2𝜀 0 𝜀 r V TFL qL (7) where ɛ 0 signifies the vacuum permittivity, ɛ r represents the relative dielectric constant of MAPbI 3 . The N traps of PSK and 4-CN/PSK(10%CN) are calculated to be 3.10 × 10 16 cm −3 and 2.04 × 10 16 cm −3 , respectively.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…To measure the trap density of the perovskite films, space charge limited current (SCLC) test is conducted on a device composed of FTO/SnO 2 /perovskite/PCBM/Au. The trap-filled limit voltage (V TFL ) is acquired through the intersection voltage of ohmic and trap-filled limit region, and the trap-state density (N traps ) can be determined by the following equation: [65,66] N traps = 2𝜀 0 𝜀 r V TFL qL (7) where ɛ 0 signifies the vacuum permittivity, ɛ r represents the relative dielectric constant of MAPbI 3 . The N traps of PSK and 4-CN/PSK(10%CN) are calculated to be 3.10 × 10 16 cm −3 and 2.04 × 10 16 cm −3 , respectively.…”
Section: Resultsmentioning
confidence: 99%
“…[ 4 , 5 ] Nonetheless, there still exist great challenges to achieve desired PCEs, such as the formation of detrimental defects inside perovskite films and at interfaces during the fabrication of PSCs. [ 6 , 7 ] These defects serve as recombination sites for photogenerated electrons and holes, causing the loss of the effective carriers. [ 8 ] In addition, the defects are highly sensitive to moisture, heat, oxygen, and ultraviolet light, leading to decomposition of the perovskite.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, we conclude that the interaction between the FA + cation and the π aromatic molecule may influence the vibration of the molecular bond of F4‐TCNQ, which changes the color and absorption spectrum of the precursor solution. [ 42 ]…”
Section: Resultsmentioning
confidence: 99%
“…[19][20][21] On the one hand, various defects (such as undercoordinated Pb 2+ atoms) are inevitably generated at the perovskite crystal surface due to the fast crystallization process and solution-processed stoichiometric issues, 22,23 which produces a series of charge recombination centers and makes the perovskite layer vulnerable to moisture and oxygen in an ambient environment. 24,25 On the other hand, the hole extraction or transfer efficiency is closely related to the interfacial energy level alignment, 26 physical contact and chemical interactions. [27][28][29][30] In order to annihilate the relevant defect induced charge traps, polymers or small molecule agents such as poly(methyl methacrylate) and long chain alkyl ammonium have been employed as passivators, from viewpoints of bonding to the under-coordinated Pb 2+ ions or grafting onto the Pb-I frameworks.…”
Section: Introductionmentioning
confidence: 99%