An Electrical Transient Model of IGBT-Diode Switching Cell for Power Semiconductor Loss Estimation in Electromagnetic Transient Simulation

Xu, Yanming; Ho, Carl Ngai Man; Ghosh, Avishek; Muthumuni, Dharshana

doi:10.1109/tpel.2019.2929113

Cited by 34 publications

(18 citation statements)

References 35 publications

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“…Examples and Applications: Switching models are commonly employed to estimate switching losses [37], determine methods to reduce switching losses [38]- [40], or develop modulation strategies that reduce output harmonics and/or switching losses [41]- [45]. Similarly, in [46], a switching model of a wind turbine was used for testing modulation control strategies for fast tracking of large changes in wind speed.…”

Section: A Switching Modelsmentioning

confidence: 99%

Review of Dynamic and Transient Modeling of Power Electronic Converters for Converter Dominated Power Systems

et al. 2021

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In response to national and international carbon reduction goals, renewable energy resources like photovoltaics (PV) and wind, and energy storage technologies like fuel-cells are being extensively integrated in electric grids. All these energy resources require power electronic converters (PECs) to interconnect to the electric grid. These PECs have different response characteristics to dynamic stability issues compared to conventional synchronous generators. As a result, the demand for validated models to study and control these stability issues of PECs has increased drastically. This paper provides a review of the existing PEC model types and their applicable uses. The paper provides a description of the suitable model types based on the relevant dynamic stability issues. Challenges and benefits of using the appropriate PEC model type for studying each type of stability issue are also presented.

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Section: A Switching Modelsmentioning

confidence: 99%

Review of Dynamic and Transient Modeling of Power Electronic Converters for Converter Dominated Power Systems

et al. 2021

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“…A detailed overview of the modeling techniques and different complexity levels of IGBT models can be found in [153,154]. Although several physical and behavioral models of the coupled MOSFET-BJT structure of an IGBT device are presented in the literature [145,146,[155][156][157][158][159][160][161][162][163][164][165][166][167], the parameter extraction procedures ask for simultaneous fitting to both static and dynamic device measurement data, which makes the modeling of IGBTs a rather complex task even for major manufacturers. Quite a few of them provide models of some IGBT devices (e.g., [165,166]) but the accuracy and stability of these models differ and the selection of an appropriate model for system level EMC simulations is still challenging.…”

Section: Power Semiconductor Modelsmentioning

confidence: 99%

EMC Component Modeling and System-Level Simulations of Power Converters: AC Motor Drives

et al. 2021

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EMC simulations are an indispensable tool to analyze EMC noise propagation in power converters and to assess the best filtering options. In this paper, we first show how to set up EMC simulations of power converters and then we demonstrate their use on the example of an industrial AC motor drive. Broadband models of key power converter components are reviewed and combined into a circuit model of the complete power converter setup enabling detailed EMC analysis. The approach is demonstrated by analyzing the conducted noise emissions of a 75 kW power converter driving a 45 kW motor. Based on the simulations, the critical impedances, the dominant noise propagation, and the most efficient filter component and location within the system are identified. For the analyzed system, maxima of EMC noise are caused by resonances of the long motor cable and can be accurately predicted as functions of type, length, and layout of the motor cable. The common-mode noise at the LISN is shown to have a dominant contribution caused by magnetic coupling between the noisy motor side and the AC input side of the drive. All the predictions are validated by measurements and highlight the benefit of simulation-based EMC analysis and filter design.

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“…The processed test-data can be surface fitted to obtain 3D plot of and against , and/or + . These can serve as a loss data library for PE converter design calculations and can be linked with PSD models in transient simulation software to obtain more practical simulation data [19].…”

Section: ) Switching Energy Loss Data Librarymentioning

confidence: 99%

“…Moreover, a device level study of a PSD also helps design engineers to predict its dynamic performance in a target application. A double pulse test (DPT) is a widely accepted method to extract the switching parameters of PSDs [1], [14]- [19]. In a typical DPT cycle, key parameters such as device voltage, current, case temperature, gate-drive resistances are varied and the switching performance of a DUT is observed and recorded in an oscilloscope.…”

Section: Introductionmentioning

confidence: 99%

“…However, the proposed SC setup offers a great degree of freedom to scientists and engineers to test a PSD in a wide range of voltage, current and temperature conditions. The practical experimental results obtained from the proposed setup has been used to tune simulated PSD models to improve accuracy so that the models can emulate real PSDs in terms of overall performance, loss behavior, voltage and current overshoots [19], [22]. The switching performance of a PSD is highly affected by layout of the DPT power circuit; hence, most of the technical literatures discusses PCB design recommendations to minimize effect of parasitic elements on the SC results [13], [23]- [24].…”

Section: Introductionmentioning

confidence: 99%

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Conceptual Design and Demonstration of an Automatic System for Extracting Switching Loss and Creating Data Library of Power Semiconductors

Ghosh

Prendergast

et al. 2020

IEEE Open J. Power Electron.

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A switching characterization (SC) test of power semiconductor devices (PSDs) gives us significant insight into the dynamic switching behavior of the device under various operating conditions. A double pulse test (DPT) is a widely used method for evaluating switching performance parameters of a PSD such as its switching losses, switching speed (di/dt, dv/dt), turn-on and turn-off times etc. The scientific information obtained from analysis of DPT results of a PSD helps in predicting its thermo-electric performance in a target power electronic converter. With conventional DPT setups, it is a time-consuming and error-prone process to manually conduct these tests under several permutations of test parameters and thereafter analyze the experimental data manually. This work presents a newly developed automated SC test system, which can run tests one after another, once the desired test parameters are entered in a graphic user interface. The test-control system also enables recording and systematic processing of the experimental switching data to deliver usable characterization results. The automatic, compact and modular design allows the proposed SC test platform to stand out from the conventional DPT setups. The design principles are experimentally verified by implementing a hardware prototype capable of testing PSDs up to 1000V, 60A, 250°C.

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An Electrical Transient Model of IGBT-Diode Switching Cell for Power Semiconductor Loss Estimation in Electromagnetic Transient Simulation

Cited by 34 publications

References 35 publications

Review of Dynamic and Transient Modeling of Power Electronic Converters for Converter Dominated Power Systems

Review of Dynamic and Transient Modeling of Power Electronic Converters for Converter Dominated Power Systems

EMC Component Modeling and System-Level Simulations of Power Converters: AC Motor Drives

Conceptual Design and Demonstration of an Automatic System for Extracting Switching Loss and Creating Data Library of Power Semiconductors

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