2008
DOI: 10.1016/j.ultramic.2007.07.010
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An electron microscope for the aberration-corrected era

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Cited by 291 publications
(211 citation statements)
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“…A probe corrected Nion UltraSTEM 100 scanning transmission electron microscope 37 was used at an acceleration voltage of 100 kV in bright field (BF) and high-angle annular dark-field (HAADF) imaging mode, the latter to reveal single metal atoms in the samples as the intensity in HAADF images is to a good approximation proportional to the atomic number (Z) as Z n , n1.7.…”
Section: Methodsmentioning
confidence: 99%
“…A probe corrected Nion UltraSTEM 100 scanning transmission electron microscope 37 was used at an acceleration voltage of 100 kV in bright field (BF) and high-angle annular dark-field (HAADF) imaging mode, the latter to reveal single metal atoms in the samples as the intensity in HAADF images is to a good approximation proportional to the atomic number (Z) as Z n , n1.7.…”
Section: Methodsmentioning
confidence: 99%
“…Aberration-corrected STEM-ADF imaging was performed with a Nion Ultra STEM 100, equipped with a cold field emission electron source and a corrector of 3rd and 5th order aberrations 28 . The microscope was operated at 60 kV accelerating voltage, which is below the knock-on radiation damage threshold of graphene.…”
Section: Methodsmentioning
confidence: 99%
“…This means that if the temperature of the microscope (or of the sample rod) changes by just 0.1°C then the sample can drift by hundreds of nm. This results in image drift rates of the order of nm per minute being common with side-entry stages in all but the most stable environments.In order to minimize these kinds of problems, Nion's cartridge-based sample stage was designed to have an OL polepiece-to-sample mechanical path of 10 cm and a thermal expansion center that coincides with the microscope's optic axis [1]. The detachable sample cartridges have no direct link to the microscope's outside.…”
mentioning
confidence: 99%
“…In order to minimize these kinds of problems, Nion's cartridge-based sample stage was designed to have an OL polepiece-to-sample mechanical path of 10 cm and a thermal expansion center that coincides with the microscope's optic axis [1]. The detachable sample cartridges have no direct link to the microscope's outside.…”
mentioning
confidence: 99%