“…Also half-integer states of G 0 are detectable, as recently reported for RRAM devices based on hafnium oxide, [20] as well as in a Cu/Zr 0.5 Hf 0.5 O 2 /Pt ECM device (only in the reset process). [49] By tuning the oxygen content, the amount of pre-existing oxygen vacancies in the functional layer can be fine-tuned, and by this, the dynamic creation and annihilation process of the conducting filament. By reducing the oxygen contents, the operation voltages can be reduced, and the electric field-driven oxygen migration promoted.…”