2019
DOI: 10.1039/c8tc04395g
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An electronic synapse memristor device with conductance linearity using quantized conduction for neuroinspired computing

Abstract: An electrochemical metallization memristor based on Zr0.5Hf0.5O2 film and an active Cu electrode with quantum conductance and neuromorphic behavior has been reported in this work.

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Cited by 62 publications
(49 citation statements)
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“…To emulate the Hebbian learning of spiking neural networks (SNN), we focus on mimicking the spike-timing-dependent plasticity (STDP) learning rule in the tri-layer TaN/HfO 2 /Al 2 O 3 /HfO 2 /ITO memristor, having been employed to simulate synapse functionality [ 50 ]. This learning rule depends on the relative time difference (Δt) of a set of spikes related to the pre-synaptic and post-synaptic neurons [ 51 ]. Design of the pre-spike, post-spike and consequent effective pulse applied to the synapse for time-division multiplexing (TDM) approach are shown in Figure 6 e. Using this pulse sequence, the obtained STDP characteristics for synaptic learning rules in the tri-layer RRAM device was employed using the TDM approach, as shown in Figure 6 d [ 50 ].…”
Section: Resultsmentioning
confidence: 99%
“…To emulate the Hebbian learning of spiking neural networks (SNN), we focus on mimicking the spike-timing-dependent plasticity (STDP) learning rule in the tri-layer TaN/HfO 2 /Al 2 O 3 /HfO 2 /ITO memristor, having been employed to simulate synapse functionality [ 50 ]. This learning rule depends on the relative time difference (Δt) of a set of spikes related to the pre-synaptic and post-synaptic neurons [ 51 ]. Design of the pre-spike, post-spike and consequent effective pulse applied to the synapse for time-division multiplexing (TDM) approach are shown in Figure 6 e. Using this pulse sequence, the obtained STDP characteristics for synaptic learning rules in the tri-layer RRAM device was employed using the TDM approach, as shown in Figure 6 d [ 50 ].…”
Section: Resultsmentioning
confidence: 99%
“…Also half-integer states of G 0 are detectable, as recently reported for RRAM devices based on hafnium oxide, [20] as well as in a Cu/Zr 0.5 Hf 0.5 O 2 /Pt ECM device (only in the reset process). [49] By tuning the oxygen content, the amount of pre-existing oxygen vacancies in the functional layer can be fine-tuned, and by this, the dynamic creation and annihilation process of the conducting filament. By reducing the oxygen contents, the operation voltages can be reduced, and the electric field-driven oxygen migration promoted.…”
Section: Electrical Characterizationmentioning
confidence: 99%
“…For a complete review about conductance quantization effects in RS devices see Refs. [23][24][25][26][27][28][29][30][31]. From the electrical viewpoint, (6) can be envisaged as two opposite biased diodes (see Fig.…”
Section: I) Current-voltage Characteristicmentioning
confidence: 99%