2014
DOI: 10.1021/jp4092859
|View full text |Cite
|
Sign up to set email alerts
|

An Evaluation of Local Thermal Analysis of Polymers on the Sub-Micrometer Scale Using Heated Scanning Probe Microscopy Cantilevers

Abstract: A basic understanding of thermal properties of polymers is of fundamental importance for the development of advanced polymers. However, up to now, mainly bulk properties have been investigated. To characterize local softening processes in polymers, a local thermal analysis (LTA) technique is applied as an add-on to a scanning probe microscope. The development of a new generation of heatable cantilever probes enables thermal analysis in the sub-μm range. This method is based on an appropriate temperature calibr… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
5
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(5 citation statements)
references
References 40 publications
(63 reference statements)
0
5
0
Order By: Relevance
“…Wollaston probes use bridged metal wires (often Pt-based) attached to a prestructured cantilever basis. ,, Although tip radii of down to 20 nm ,, have been reported using very special treatments, typical apex radii are in the range of some hundreds of nanometers to a few micrometers, ,, which are strongly limiting achievable resolution and positioning accuracy. The second approach uses U-shaped cantilevers, consisting of highly doped Si side-wall elements and low-doped tip areas in between. , Although tip radii below 100 nm can be achieved, , the “active areas” are fully connected with the entire cantilever, representing a huge heat sink. By that, low temperatures are more complicated to access when operated in SThM mode. ,, A combination of both approaches led to the introduction of surface-modified cantilevers: lithography-based methods are used to selectively fabricate metal structures across the tip, which can be understood as structured, conductive atomic force microscopy (C-AFM) tips.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Wollaston probes use bridged metal wires (often Pt-based) attached to a prestructured cantilever basis. ,, Although tip radii of down to 20 nm ,, have been reported using very special treatments, typical apex radii are in the range of some hundreds of nanometers to a few micrometers, ,, which are strongly limiting achievable resolution and positioning accuracy. The second approach uses U-shaped cantilevers, consisting of highly doped Si side-wall elements and low-doped tip areas in between. , Although tip radii below 100 nm can be achieved, , the “active areas” are fully connected with the entire cantilever, representing a huge heat sink. By that, low temperatures are more complicated to access when operated in SThM mode. ,, A combination of both approaches led to the introduction of surface-modified cantilevers: lithography-based methods are used to selectively fabricate metal structures across the tip, which can be understood as structured, conductive atomic force microscopy (C-AFM) tips.…”
Section: Introductionmentioning
confidence: 99%
“…The second approach uses U-shaped cantilevers, consisting of highly doped Si side-wall elements and low-doped tip areas in between. 1,15 Although tip radii below 100 nm can be achieved, 16,17 the "active areas" are fully connected with the entire cantilever, representing a huge heat sink. By that, low temperatures are more complicated to access when operated in SThM mode.…”
Section: Introductionmentioning
confidence: 99%
“…A heated AFM cantilever overcomes this barrier but a delicate calibration is needed. 30 Another challenge is to probe the T g of partly (thin films) or entirely (dots) spatially confined materials. Ellison et al have succeeded, for the first time, to measure the T g distribution in nanoscopically confined structures through fluorescence of a pyrene-labeled polystyrene film.…”
mentioning
confidence: 99%
“…However, these tools often require macroscopic heating/cooling of the whole specimen. A heated AFM cantilever overcomes this barrier but a delicate calibration is needed …”
mentioning
confidence: 99%
“…Localised quantitative thermal analysis, often referred to as local thermal analysis (LTA), is also possible using a variation this technique. These techniques use silicon probes with highly doped conductive legs and a low doped resistive area close to the tip that afford spatial resolution in the nm range, as shown in figure 32(a) (Fischinger et al 2014). Applying a voltage across the cantilever legs induces an electric current, which gives rise to resistive heating in the tip region due to Joule heating.…”
Section: Afm-thermal Analysismentioning
confidence: 99%