2017 IEEE International Electron Devices Meeting (IEDM) 2017
DOI: 10.1109/iedm.2017.8268400
|View full text |Cite
|
Sign up to set email alerts
|

An experimental CMOS photon detector with 0.5e-RMS temporal noise and 15μm pitch active sensor pixels

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 3 publications
0
0
0
Order By: Relevance