An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results

Abstract

Unlike graded data of common semiconductor test results storing in relational databases, log data in the standard test data format (STDF) contain millions of test data entries. In a semiconductor packaging and testing factory, a semiconductor wafer or integrated circuit tests generate thousands of STDF files each day; therefore, how to store these massive databases is a crucial topic. Different products correspond to different test items and STDF content; if a relational database is used to store all forms of data, the practical operation becomes challenging. This paper used a NoSQL document-oriented database collocated with a Docker container to build a system, named the scalable STDF data (SSD) framework, for storing semiconductor test data. According to semiconductor test operations, the SSD framework first converts STDF files into an open standard format for data transmission and subsequently transfers them to the database. The use of NoSQL databases allows for flexibility of specifications of STDF content, and a Docker container exhibits features such as rapid deployment and high scalability. The SSD framework meets the requirements of semiconductor testing for throughput, latency, and parallel experimental projects; possesses excellent execution efficiency; and provides flexible data storage services in a semiconductor testing environment where processing a large quantity of data is required. From our simulation results, the major performance of the proposed system depends on the hardware properties. The higher hardware distribution degree provides better performance. Docker container provides more connections and the scalability of storage, but higher software distribution contributes limited performance enhancement. INDEX TERMS Flexible data storage, scalable STDF data, semiconductor testing, standard test data format.

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“…e experiments suggest that the method described in this research is successful, has a broad application potential, and is adaptable. Interval midpoint method [1,4] 0.868 0.655 0.735 0.435 [1,8] 0.878 0.635 0.728 0.455 [1,12] 0.865 0.603 0.655 0.429 [1,16] 0.792 0.598 0.539 0.421 [1,20] 0.768 0.568 0.435 0.386…”

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Single board re-spin for testing bridge transducer products

“…CorL8 is the correlation tool used in this setup. A standard test data format (STDF) data tool shows the raw data, pareto chart of the top bin failure, and cumulative plots of tests [25]. This tool is also used for generating STDF files and performing statistical analysis on the population of tested devices.…”

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“…Advanced approaches to automatic adjustment enable developers to optimize search steps for data transforma-The associate editor coordinating the review of this manuscript and approving it for publication was Giovanni Pau . tion, design, and software hyperparameter configuration [38], [39]. Therefore, it can significantly impact the entire process of model development.…”