An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers

Shi, Jianxin; Jin, Ensun; Ma, Jing; Dai, Ying; Zhang, Xinfa

doi:10.1016/0026-2714(94)90512-6

Cited by 11 publications

(2 citation statements)

References 3 publications

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“…Low-frequency, 1/f , noise is known to be a sensitive measure of defect concentration in the electronic device and it is increased by nearly all defects [1]. It has been shown that 1/f noise is a reliability indicator for optical devices such as solar cells [2], LEDs [3] and diode lasers [4,5] but more work is needed on a wider range of devices under different stress regimes to verify its general usefulness There are many models and interpretations of 1/f noise. This investigation was not designed specifically to test such models but to determine the usefulness of noise as a reliability indicator.…”

Section: Introductionmentioning

confidence: 99%

Low-frequency noise used as a lifetime test of LEDs

Ursuțiu

Jones

1996

Semicond. Sci. Technol.

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Low-frequency noise (1/f noise) has been measured in light emitting diodes (LEDs) which have been subjected to an accelerated life test by means of large forward bias current pulses. Over a large range of stress pulses the electrical and functional LED properties remain unaltered but an increase in the 1/f noise level was seen and this was correlated with the device reliability. The product 'initial noise × initial rate of noise increase' correlated best with the LED lifetime.

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Section: Introductionmentioning

confidence: 99%

Low-frequency noise used as a lifetime test of LEDs

Ursuțiu

Jones

1996

Semicond. Sci. Technol.

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show abstract

“…It has been shown that 1/f noise is a reliability indicator for optical devices such as solar cells [2], LEDs [3] and diode lasers [4,5] but more work is needed on a wider range of devices under different stress regimes to verify its general usefulness There are many models and interpretations of 1/f noise. This investigation was not designed specifically to test such models but to determine the usefulness of noise as a reliability indicator.…”

Section: Introductionmentioning

confidence: 99%