2013
DOI: 10.1109/temc.2012.2207726
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An Improved Dipole-Moment Model Based on Near-Field Scanning for Characterizing Near-Field Coupling and Far-Field Radiation From an IC

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Cited by 182 publications
(53 citation statements)
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“…Information about these sources can be obtained via Near-Field Scanning (NFS); the focus has been here in practice mainly on obtaining field emissions from time harmonic and deterministic sources [3], [4], [5]. Measuring the radiated emissions from PCBs has been used to study the electromagnetic fields in regions surrounding integrated circuits (ICs) [6], to estimate the currents flowing through chips [7], and to extract effective dipole moments for source reconstruction [8], [9], [10], [11], [12], [13].…”
Section: Introductionmentioning
confidence: 99%
“…Information about these sources can be obtained via Near-Field Scanning (NFS); the focus has been here in practice mainly on obtaining field emissions from time harmonic and deterministic sources [3], [4], [5]. Measuring the radiated emissions from PCBs has been used to study the electromagnetic fields in regions surrounding integrated circuits (ICs) [6], to estimate the currents flowing through chips [7], and to extract effective dipole moments for source reconstruction [8], [9], [10], [11], [12], [13].…”
Section: Introductionmentioning
confidence: 99%
“…Several methods have been proposed to characterise radiated emissions through near-field scanning (NFS) of deterministic fields [1], [2], [3], [4], [5]. Near-field measurements require less space, have better signal-to-noise ratios and are simpler than far-field measurements [5].…”
Section: Introductionmentioning
confidence: 99%
“…For this purpose, the least-square method has been used for the optimization of the fitness function. The same optimization method has been used in [4], but with a more adapted approach for printed circuits and where they have used an improved dipole model moment using the regularization technique. The obtained results with both methods were conclusive.…”
Section: Introductionmentioning
confidence: 99%
“…Because of the magnetic cores and the vertical disposition of some semiconductor components (due to space and thermal constraints), the third dimension of the circuit topology is more pronounced. This makes the electromagnetic field distribution in the near field region more complex than in [3] and [4], where the circuits are considered planar. Thus, the inverse problem becomes more complex to solve because of the high nonlinearity of the fitness function.…”
Section: Introductionmentioning
confidence: 99%
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