This chapter describes methods for evaluating the lateral homogeneity (or lateral trends) of porous silicon over the mm to wafer-scale prepared by anodization, stain-etching, or metal-assisted chemical etching (MACE). Methods described include spot reflectance measurements along transects or at selected points across the porous silicon, hyperspectral imaging, luminescence imaging, Fourier transform infrared (FTIR) mapping, ellipsometry, and chemography. Exemplars are shown of high spatial resolution mapping of intact Fabry-Perot and rugate porous silicon samples, showing inhomogenities due to current density nonuniformity, bubbles or other localized defects, and striations.