1996
DOI: 10.4028/www.scientific.net/msf.228-231.107
|View full text |Cite
|
Sign up to set email alerts
|

An Improved X-Ray Image Plate Detector for Diffractometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

1997
1997
2018
2018

Publication Types

Select...
4
3

Relationship

1
6

Authors

Journals

citations
Cited by 8 publications
(4 citation statements)
references
References 0 publications
0
4
0
Order By: Relevance
“…Details of the image acquisition system have been published elsewhere [1]. Due to the high dynamical response and linearity of our X-ray detector [3] we are able to perform quantitative image analysis. In particular we are able to extract the absolute values of the source material density within an error of less than 20%.…”
Section: X-ray Imagingmentioning
confidence: 99%
See 1 more Smart Citation
“…Details of the image acquisition system have been published elsewhere [1]. Due to the high dynamical response and linearity of our X-ray detector [3] we are able to perform quantitative image analysis. In particular we are able to extract the absolute values of the source material density within an error of less than 20%.…”
Section: X-ray Imagingmentioning
confidence: 99%
“…The digital X-ray imaging system is set up with a high resolution and high-speed X-ray detector based on image plates and digital recording [3] ( Fig. 1, left).…”
Section: X-ray Imagingmentioning
confidence: 99%
“…78 The position sensitive detectors based on CCDs or linear proportional counters are limited in their spatial resolution or could be very expensive if designed to cover the broad range of angles usually required in powder diffraction experiments. The IP-detectors, on the other hand have been developed in various configurations ranging from flat plates [79][80][81] , to cylindrical curved plates. [82][83][84][85][86] The usual limitations encountered with the IP detectors pertain to the requirement for an external IP scanner.…”
Section: Instrumentation For In-situ High Temperature X-ray Diffractionmentioning
confidence: 99%
“…Construction of a fast PSD system to cover a wide 2 range with adequate spatial resolution can be expensive, particularly in systems which use linear sensitive proportional counters or CCDs. IP detectors which use a phosphor film tend to be less expensive and have been developed both as flat plates (Gualtieri et al, 1996;Rizzo et al, 1995;Thoms et al, 1996) and as cylindrical curved detectors (Fujiwara et al, 2000;Garrett et al, 1995;Kellermann et al, 2001;Nishibori et al, 2001a,b). However, one problem with the IP detectors has been the delay in data acquisition, either owing to the size of the area detector or to the requirement of an external scanner, which can also compromise reproducibility.…”
Section: Introductionmentioning
confidence: 99%