An inference method for temperature step‐stress accelerated life testing

Gouno, Evans

doi:10.1002/qre.362.abs

Cited by 12 publications

(8 citation statements)

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“…Regarding censoring, type-I censoring has been treated by Seo and Yum [32] and Xiong and Ji [42] while type-I progressive censoring by Wu et al [40]. Regarding the connection of successive stress levels, the most common assumption is the CE (Bai et al [4], Gouno [14], Xiong and Ji [42], Tsai et al [34], Wu et al [40]). The TFR assumption was adopted by Van Dorp and Mazzuchi [35], Van Dorp and Mazzuchi [36], Lee and Pan [27] and Wang et al [39].…”

Section: Introductionmentioning

confidence: 97%

“…In the context of interval sampling, the lifetime distributions usually assumed are the exponential (Bai et al [4], Gouno [14], Wu et al [40]) and the Weibull (Lee and Pan [27]), while the Rayleigh and the geometric distributions have also been considered in Tsai et al [34] and Wang et al [39], respectively. Regarding censoring, type-I censoring has been treated by Seo and Yum [32] and Xiong and Ji [42] while type-I progressive censoring by Wu et al [40].…”

Section: Introductionmentioning

confidence: 98%

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The step-stress tampered failure rate model under interval monitoring

Bobotas

Kateri

2015

Statistical Methodology

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Section: Introductionmentioning

confidence: 97%

Section: Introductionmentioning

confidence: 98%

The step-stress tampered failure rate model under interval monitoring

Bobotas

Kateri

2015

Statistical Methodology

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“…Miller and Nelson and Bai et al initiated the formal research in this area with a simple step‐stress ALT. Later, Gouno studied the inferential method and design optimization for a temperature step‐stress ALT. On the inferential research side, Balakrishnan et al and Balakrishnan and Han developed the exact estimation methods for a simple step‐stress ALT with/without competing risks for failure under type II censoring, and then, Han and Balakrishnan explored the problem under type I censoring.…”

Section: Introductionmentioning

confidence: 99%

Optimal design of a simple step‐stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes

Han

2019

Quality & Reliability Eng

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Thanks to continuously advancing technology and manufacturing processes, the products and devices are becoming highly reliable. However, performing the life tests of these products at normal operating conditions becomes extremely difficult, if not impossible, due to their long life spans. This can result in missed opportunities to introduce the products to the market in a timely manner and eventually loss of the market share. This problem is solved by accelerated life tests where the test units are subjected to higher stress levels than the normal usage level so that information on the lifetime parameters can be obtained more quickly. The lifetime at the design condition is then estimated through extrapolation using a regression model. In this work, the design optimization of a simple step-stress accelerated life test under progressive type I censoring is studied with nonuniform step durations for assessing the reliability characteristics of a solar lighting device. Allowing the intermediate censoring to take place at the stress change time point, the nature of the optimal stress duration is demonstrated under various design criteria including D-optimality, C-optimality, A-optimality, and E-optimality. The existence of these optimal designs is investigated in detail for exponential lifetimes with a single stress variable, and the effect of the intermediate censoring proportion is assessed on the design efficiency. KEYWORDS accelerated life tests, design of experiment, exponential distribution, Fisher information, progressive type I censoring, step-stress loading Qual Reliab Engng Int. 2019;35:1297-1312.wileyonlinelibrary.com/journal/qre

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“…It is also typically supposed that the different risk factors are independent so as to avoid the problem of model identifiability. [3] Gouno [4] discussed inference analysis for stepstress accelerated life testing (ALT) in terms of temperature stress. Bunea and Mazzuchi [5] considered multiple failure modes under ALT in the view of Bayesian framework.…”

Section: Introductionmentioning

confidence: 99%

Exact inference for competing risks model with generalized type-I hybrid censored exponential data

Mao

Shi

Sun

2013

Journal of Statistical Computation and Simulation

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Recently, exact inference under hybrid censoring scheme has attracted extensive attention in the field of reliability analysis. However, most of the authors neglect the possibility of competing risks model. This paper mainly discusses the exact likelihood inference for the analysis of generalized type-I hybrid censoring data with exponential competing failure model. Based on the maximum likelihood estimates for unknown parameters, we establish the exact conditional distribution of parameters by conditional moment generating function, and then obtain moment properties as well as exact confidence intervals (CIs) for parameters. Furthermore, approximate CIs are constructed by asymptotic distribution and bootstrap method as well. We also compare their performances with exact method through the use of Monte Carlo simulations. And finally, a real data set is analysed to illustrate the validity of all the methods developed here.

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An inference method for temperature step‐stress accelerated life testing

Cited by 12 publications

References 0 publications

The step-stress tampered failure rate model under interval monitoring

The step-stress tampered failure rate model under interval monitoring

Optimal design of a simple step‐stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes

Exact inference for competing risks model with generalized type-I hybrid censored exponential data

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