An interleaved comb ion deflection gate for m/z selection in time-of-flight mass spectrometry

Abstract

Articles you may be interested inA field-programmable-gate-array based time digitizer for the time-of-flight mass spectrometry Rev. Sci. Instrum. 85, 045115 (2014); 10.1063/1.4870922 Time-of-flight mass spectrometry for time-resolved measurements Rev. Sci. Instrum. 78, 034103 (2007); 10.1063/1.2712797 Correction of dead time effects in timeofflight mass spectrometry J. Vac. Sci. Technol. A 12, 405 (1994); 10.1116/1.579255 MASTIF: Mass analysis of secondaries by timeofflight technique. A new approach to secondary ion mass spectrometry Rev. Sci. Instrum. 60, 3188 (1989); 10.1063/1.1140550Timeofflight secondary ion mass spectrometry of polymer materials Modulation of an ion beam is crucial to several applications in time-of-flight ͑TOF͒ mass spectrometry, especially for tandem TOF instruments which require selection of a particular precursor m/z ͑mass to charge͒ value prior to fragmentation. Here we present a detailed description of an ''interleaved comb'' ion deflection gate device with suitable electronics which offers a performance advantage over the more commonly used deflection plate devices. We demonstrate unit mass resolution for selection to m/z 167 in the tandem TOF instrument constructed in our laboratory. Calculations suggest that the real time of unit resolution for our experimental arrangement is greater than 300.

A high resolving power ion selector for post-source decay measurements in a reflecting time-of-flight mass spectrometer

“…8(a). The selection window was shifted to the first 13 C isotope (Fig. 8(c)) by keeping Dt d set at 280 ns but increasing t t-dual (m) by 3 ns, which agrees reasonably with the calculated time (1.9 ns) separating the 12 C and 13 C ions at the entrance to the ion selector.…”

“…6 Vlasak et al achieved a resolving power of $170 in isolating diphenylmethane molecular ions (m/z 167, 650 eV), and they estimated that a resolving power greater than 300 should be possible by optimizing their device. 13 These resolving powers are among the highest obtained with single deflectors. When kinetic energies equal or exceed 10 keV, which is typically the case in MALDI analyses, the mass selectivities of single-deflector units are substantially poorer than those obtained in these two studies.…”

“…To date, either a conventional set of deflection plates [4][5][6][7][8][9][10] or a single set of interleaved wire-combs [11][12][13] has been used in tandem TOF instruments as the MS1 unit. The latter structure was first proposed by Loeb 14 and subsequently constructed and demonstrated as an electron filter by Cravath 15 and by Bradbury.…”

Simple template-based method to produce bradbury-nielsen gates

“…The most common method is to weave wires into two sets of holes on an insulating frame with a wire spacing of ϳ1 mm [7,20,21]. Some other methods include weaving against the threads on nylon bolts [22], etching a thin metal foil [23], and wire-bonding to metal deposited on ceramic frame [24].…”

Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions

“…The secondary ion deflector consists of two electrically insulated sets of thin wires mounted parallel to each other. This electrode is called 'the interleaved comb ion (mass) deflection gate', and has been proved to have high availability for TOF-MS by Weinkauf et al [6] and Vlasak et al [7]. For the interleaved comb deflector, secondary ions pass it in 10 ns because of the short deflector length.…”