2011
DOI: 10.4028/www.scientific.net/amr.403-408.3
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An Investigation of the Nano-Structure Titanum Dioxde Thin Films as a Function of Film Thickness

Abstract: Using resistive heated method, Ti films of different thickness ranging from 10 to 200 nm were deposited and post-annealed at a temperature of 473K with a flow of oxygen. The optical properties were measured by transmission spectroscopy in spectral range of 200-2500 nm. The optical functions were obtained from the Kramers-Kronig analysis of the reflectivity curves. The effective medium approximation analysis was employed to establish the relationship between the nano-structure and Effective-Media Approximation … Show more

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