ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design 2006
DOI: 10.1109/lpe.2006.4271852
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An Optimal Analytical Solution for Processor Speed Control with Thermal Constraints

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Cited by 18 publications
(25 citation statements)
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“…As the power density continues scaling up, the thermal-related issues are exasperated in embedded systems. Researchers have recently proposed off-line algorithms [12,13,14,15,17,22] which slow down the operating speed of the processor if needed to manage the thermal behavior of embedded systems so that the chip operates below its critical temperature. Those algorithms target deterministic applications.…”
Section: Related Workmentioning
confidence: 99%
See 1 more Smart Citation
“…As the power density continues scaling up, the thermal-related issues are exasperated in embedded systems. Researchers have recently proposed off-line algorithms [12,13,14,15,17,22] which slow down the operating speed of the processor if needed to manage the thermal behavior of embedded systems so that the chip operates below its critical temperature. Those algorithms target deterministic applications.…”
Section: Related Workmentioning
confidence: 99%
“…As a consequence, embedded systems confront even worse thermal challenges. To solve these issues, researchers have recently proposed several thermal management techniques [12,13,14,15,17,19,22] where workloads are periodic and deterministic. In some applications, however, embedded systems run stochastic workloads [18], where novel approaches are needed to manage system thermal behavior.…”
Section: Introductionmentioning
confidence: 99%
“…While some others (e.g. [6], [10], [15], [26], [31]) intend to minimize the peak temperature or to guarantee the given maximum temperature constraints when scheduling task sets.…”
Section: Related Workmentioning
confidence: 99%
“…Researchers have proposed high-level models and used them to obtain analytical results or heuristics for thermal management [3][4][5][6][7][8]. However, most of these works did not address multi-core processors and they all use very simple power/thermal models which do not capture some or all of the following important effects: (a) the variations of power-density over different chip blocks, which leads to hotspots (see [9]), (b) leakage dependence on temperature (LDT), which is significant for 65 nm and beyond (see [5,10]), and (c) the contrast in the thermal response times of the die and package.…”
Section: Introductionmentioning
confidence: 99%