2016
DOI: 10.17485/ijst/2016/v9i44/102877
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An Optimized Successive Approximation Register used in ADC for Wireless Sensor Nodes

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“…Process variability and component tolerance factors are inherent variations developed in proposed scheme at each transistor. A framework basing on machine learning techniques is designed in this study which reduces the non-idealities such as data variability accounts and variability in channel at receiver end (11) .…”
Section: Introductionmentioning
confidence: 99%
“…Process variability and component tolerance factors are inherent variations developed in proposed scheme at each transistor. A framework basing on machine learning techniques is designed in this study which reduces the non-idealities such as data variability accounts and variability in channel at receiver end (11) .…”
Section: Introductionmentioning
confidence: 99%