An out-of-plane detector for surface x-ray diffraction

Taylor, J.S.G.; Norris, C.; Vlieg, E.; Lohmeier, M.; Turner, Tracy

doi:10.1063/1.1147188

Cited by 13 publications

(6 citation statements)

References 4 publications

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“…The more recent diffractometers, however, have extra degrees of freedom © 1997 International Union of Crystallography Printed in Great Britain -all rights reserved (on the detector), enabling a wide range of perpendicular momentum transfer to be reached and thus allowing atomic coordinates to be determined with high accuracy in all three directions (Ferrer, Torrelles, Etgens, Van der Vegt & Fajardo, 1995;Lohmeier et al, 1996). Different geometries for such diffractometers are in use: there are five-circle diffractometers with and without extra detector arms (Vlieg, Van der Veen, Macdonald & Miller, 1987;Taylor, Norris, Vlieg, Lohmeier & Turner, 1996), six-circle diffractometers (Lohmeier & Vlieg, 1993) and so-called (2+2)-circle diffractometers (Evans-Lutterodt & Tang, 1995).…”

Section: Introductionmentioning

confidence: 99%

Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

Vlieg¹

1997

J Appl Crystallogr

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The geometrical and resolution corrections are derived that occur in the measurement of the integrated intensities of surface diffraction rods for the case of a sixcircle diffractometer. Since the six-circle geometry entails as special cases the five-circle and the z-axis diffractometers, the results are valid for these geometries as well. The derivations are valid for any incoming or outgoing angle of the X-ray beam, and are particularly important for measurements at large perpendicular momentum transfer. Expressions are derived for the integrated intensity from rocking scans, from stationary measurements and from reflectivity data. With all correction factors known, it is possible to derive the structure factors with a common scale factor from all these types of scans. It is expected that area detectors combined with stationary measurements will find widespread use in the surface X-ray diffraction community.

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Section: Introductionmentioning

confidence: 99%

Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

Vlieg¹

1997

J Appl Crystallogr

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298

267

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“…For the SXRD measurements, INGRID was coupled to a five-circle diffractometer, equipped with an additional manual sixth circle, which almost doubles the amount of accessible reciprocal space in the out of plane direction [16]. An X-ray wavelength of 0.9 Å was selected to maximise the available reciprocal space, whilst maintaining a useable photon flux.…”

Section: Methodsmentioning

confidence: 99%

A surface X-ray diffraction study of Ni(110)c(2×2)-CN

et al. 2004

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“…17,18 This chamber allows the use of the five-circle surface X-ray diffractometer with an ultrahigh vacuum (UHV) sample environment. The horizontal detector angle can be set to two fixed positions at γ = 0 • and γ = 15 • .…”

Section: Methodsmentioning

confidence: 99%

A SURFACE ANOMALOUS DIFFRACTION STUDY OF THE Ni(100)(3×3)-(Cs+O) SYSTEM

et al. 1999

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Alkali metal coadsorption systems represent a step along the pathway from simple model adsorbate overlayers to more technologically relevant real systems. However, such is their complexity that very few systems have been structurally determined. Here we present a surface X-ray diffraction investigation of one of these systems, Ni(100)-(3×3)-(Cs+O). Here a structural determination is particularly challenging due to the presence of three species in the surface layers and by the size of the unit cell. As a first step, anomalous scattering has been used to determine whether there is a contribution of the nickel substrate to the fractional order diffraction intensity. Measurements of the fractional order rods at 10 eV and 200 eV below the nickel K edge (8333 eV) were used to probe the nickel contribution to the fractional order rods. It was found that the intensity of the scattering was unchanged, indicating that the fractional order peaks are caused by scattering from the coadsorbates only. This shows that the nickel surface layers are not changed by the adsorption and thus sets a useful constraint on the number of possible structures.

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An out-of-plane detector for surface x-ray diffraction

Abstract: Simultaneous in-plane and out-of-plane exchange bias using a single antiferromagnetic layer resolved by x-ray magnetic circular dichroism Appl. Phys. Lett. 95, 152515 (2009);

Cited by 13 publications

References 4 publications

Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

A surface X-ray diffraction study of Ni(110)c(2×2)-CN

A SURFACE ANOMALOUS DIFFRACTION STUDY OF THE Ni(100)(3×3)-(Cs+O) SYSTEM

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