1997
DOI: 10.1107/s0021889897002537
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Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

Abstract: The geometrical and resolution corrections are derived that occur in the measurement of the integrated intensities of surface diffraction rods for the case of a sixcircle diffractometer. Since the six-circle geometry entails as special cases the five-circle and the z-axis diffractometers, the results are valid for these geometries as well. The derivations are valid for any incoming or outgoing angle of the X-ray beam, and are particularly important for measurements at large perpendicular momentum transfer. Exp… Show more

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Cited by 298 publications
(278 citation statements)
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“…The same software packages that were used in Refs. 3 and 6 were employed for this pur-pose, i.e., the Barberi-Van Hove Automated Tensor LEED code 10 and the DL_LEED package 11 for LEED-IV, and the ROD software 12 for SXRD. Furthermore, the self-consistent phase shifts applied in Ref.…”
mentioning
confidence: 99%
“…The same software packages that were used in Refs. 3 and 6 were employed for this pur-pose, i.e., the Barberi-Van Hove Automated Tensor LEED code 10 and the DL_LEED package 11 for LEED-IV, and the ROD software 12 for SXRD. Furthermore, the self-consistent phase shifts applied in Ref.…”
mentioning
confidence: 99%
“…The integrated intensities were converted into structure factor amplitudes by applying the necessary geometrical and resolution corrections. 19 Model calculations and fitting were done using the ROD code, using 2 as goodness-of-fit criterion. 20 We measured in total 155 nonequivalent reflections, consisting of the (00) (or specular), (20) and ͑22͒ rods, with an agreement factor of 8% when averaged over all different samples used.…”
mentioning
confidence: 99%
“…They are converted into structure factor amplitudes by applying the appropriate geometrical and resolution corrections. 14 This correction procedure puts all rods on the same relative scale, except for the specular data. The negative values for the diffraction index l are obtained by inverting the structure factors according to Friedel's rule.…”
Section: Methodsmentioning
confidence: 99%