2000
DOI: 10.1016/s0001-8686(99)00037-8
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An overview of polymer latex film formation and properties

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Cited by 532 publications
(404 citation statements)
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“…It is well known that when polymer films are cast from the latex solutions surfactant molecules in the latices migrate toward the interfaces during film formation, decreasing the film performances, in particular, for paints and other protective coatings [11][12][13]. In this context, the disappearance of ionic species in the present polymers recovered by hydrolysis would modify the surface properties of the cast films.…”
Section: Surface Properties Of Polymer Filmsmentioning
confidence: 99%
“…It is well known that when polymer films are cast from the latex solutions surfactant molecules in the latices migrate toward the interfaces during film formation, decreasing the film performances, in particular, for paints and other protective coatings [11][12][13]. In this context, the disappearance of ionic species in the present polymers recovered by hydrolysis would modify the surface properties of the cast films.…”
Section: Surface Properties Of Polymer Filmsmentioning
confidence: 99%
“…The film-formation process has been studied in considerable detail, as summarized in some recent review articles on this subject. 1,2 It is known, for example, that the film-formation process depends not only on the chemistry of the individual latex particles but also on the particle concentration, presence of surfactants, and humidity and temperature at which the films are formed. 3,4 It is generally accepted that latex film formation occurs in a series of steps.…”
Section: Introductionmentioning
confidence: 99%
“…They showed that PFB:F8BT NPOPV devices with Al and Ca/Al cathodes exhibit qualitatively very similar behaviour, with a peak PCE of ~0.4% for Al (consistent with Stapleton's work [30]) and ~0.8% for Ca/Al, and that there is a distinct optimized thickness for the NP devices ( Figure 3). The optimal thickness is a consequence of the competing physical effects of the repair and filling of defects for thin films [32,33] and the development of stress cracking in thick films [34]. Indeed, Stapleton's work showed that the optimal layer thickness in these devices corresponds to the critical cracking thickness (CCT) above which stress cracking occurs, resulting in low shunt resistance and a reduction in device performance [30].…”
Section: The Pfb:f8bt Nanoparticulate Organic Photovoltaic (Npopv) Mamentioning
confidence: 99%