An OVT Based on Conoscopic Interference and Position Sensitive Detector

Huang, Yifan; Xu, Qi; Tan, Qiao; Xu, Zhikun

doi:10.1109/jsen.2016.2629493

Cited by 11 publications

(8 citation statements)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The nonlinear demodulation mode of φ ′ in the OVT has other defects, such as light power dependency, nonlinear measurement, and limitations on measurement range against sensitivity [3], etc.…”

Section: Nonlinear Demodulation Modementioning

confidence: 99%

“…The optical voltage transducer (OVT) based on the Pockels effect has the advantages of good electrical insulation, large bandwidth and strong anti-electromagnetic interference [1][2][3], which is deem to the ultimate development of high voltage measurement technologies. However, the thermal stress includes the external thermal stress and internal one induced by the temperature drift affects the optical characteristics of electro-optic crystals [4,5], which introduces the additional phase delay [4,6,7].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

AC zero crossing compensation for thermal stress linear birefringence in optical voltage transducer

Huang,

Xu,

et al. 2023

Meas. Sci. Technol.

Self Cite

View full text Add to dashboard Cite

The optical voltage transducer (OVT) based on the Pockels effect has a perennial issue of the thermal stress linear birefringence in the electro-optic crystal being overlapped with the electro-optic phase delay, which is difficult to be eliminated and seriously affects the measurement accuracy and reliability. In this paper an AC zero crossing compensation method for thermal stress linear birefringence is proposed. It is based on that when the steady-state AC voltage crosses zero points the electric field is zero, and the electro-optic crystal does not have any electro-optic effect, so the electro-optic phase delay is zero. In this case, the output of the OVT is an additional phase delay caused by the thermal stress linear birefringence, which can be separated and compensated by the linear demodulation OVT and the AC zero crossing detection circuit. The experimental results show that in the temperature range of -40℃ to 70℃, the measurement accuracy of the OVT after thermal stress linear birefringence compensation is improved from 0.5 class to 0.2 class. This method is helpful for the practicality of the OVT.

show abstract

Section: Nonlinear Demodulation Modementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

AC zero crossing compensation for thermal stress linear birefringence in optical voltage transducer

Huang,

Xu,

et al. 2023

Meas. Sci. Technol.

Self Cite

View full text Add to dashboard Cite

show abstract

“…However, the electric field distributions in the crystal cannot be measured directly by the existing experimental methods. In terms of the relationship between the output light intensity I and the voltage U of the OVS given by [2,3]…”

Section: Experimental Setupsmentioning

confidence: 99%

“…An optical voltage sensor (OVS) can be modulated in a transverse or longitudinal mode [1][2][3][4]. The pertinent advantages of the transverse mode are therefold: the half-wave voltage can be adjusted in accordance with electro-optic crystal dimensions; the design of the electrodes is simple; and the structure is compact and easy to install [5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Optimization of Pockels electric field in transverse modulated optical voltage sensor

Huang¹,

Xu²,

Chen³

et al. 2018

Meas. Sci. Technol.

Self Cite

View full text Add to dashboard Cite

This paper investigates the possibilities of optimizing the Pockels electric field in a transverse modulated optical voltage sensor with a spherical electrode structure. The simulations show that due to the edge effect and the electric field concentrations and distortions, the electric field distributions in the crystal are non-uniform. In this case, a tiny variation in the light path leads to an integral error of more than 0.5%. Moreover, a 2D model cannot effectively represent the edge effect, so a 3D model is employed to optimize the electric field distributions. Furthermore, a new method to attach a quartz crystal to the electro-optic crystal along the electric field direction is proposed to improve the non-uniformity of the electric field. The integral error is reduced therefore from 0.5% to 0.015% and less. The proposed method is simple, practical and effective, and it has been validated by numerical simulations and experimental tests.

show abstract

“…In addition, optical voltage sensors are a precision instrument and their large-scale application is restricted by their high manufacturing cost and ease of damage during long-distance transportation [ 18 , 19 , 20 , 21 ]. Compared with optical methods, D-dot sensors, which have a simple structure, low cost and a wide dynamic range, are easier to use and are more extensively used [ 14 , 22 ]. Therefore, applying Gaussian integrals to the D-dot sensor measurement system, with its simple structure and low cost, will have high research and application values.…”

Section: Introductionmentioning

confidence: 99%

Research on Transmission Line Voltage Measurement Method of D-Dot Sensor Based on Gaussian Integral

Wang

Zhao

et al. 2018

Sensors

View full text Add to dashboard Cite

D-dot sensors meet the development trend towards the downsizing, automation and digitalization of voltage sensors and is one of research hotspots for new voltage sensors at present. The traditional voltage measurement system of D-dot sensors makes possible the reverse solving of wire potentials according to the computational principles of the electric field inverse problem by measuring electric field values beneath the transmission line. Nevertheless, as it is limited by the solving method of the electric field inverse problem, the D-dot sensor voltage measurement system is struggling with solving difficulties and poor accuracy. To solve these problems, this paper suggests introducing a Gaussian integral into the D-dot sensor voltage measurement system to accurately measure the voltage of transmission lines. Based on studies of D-dot sensors, a transmission line voltage measurement method based on Gaussian integrals is proposed and used for the simulation of the electric field of a 220 kV and a 20 kV transmission line. The feasibility of the introduction of the Gaussian integral to solve transmission line voltage was verified by the simulation results. Finally, the performance of the Gaussian integral was verified by an experiment using the transmission line voltage measurement platform. The experimental results demonstrated that the D-dot sensor measurement system based on a Gaussian integral achieves high accuracy and the relative error is lower than 0.5%.

show abstract

An OVT Based on Conoscopic Interference and Position Sensitive Detector

Cited by 11 publications

References 12 publications

AC zero crossing compensation for thermal stress linear birefringence in optical voltage transducer

AC zero crossing compensation for thermal stress linear birefringence in optical voltage transducer

Optimization of Pockels electric field in transverse modulated optical voltage sensor

Research on Transmission Line Voltage Measurement Method of D-Dot Sensor Based on Gaussian Integral

Contact Info

Product

Resources

About