2018
DOI: 10.1016/j.nanoen.2018.08.037
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An STM – SEM setup for characterizing photon and electron induced effects in single photovoltaic nanowires

Abstract: Vertical arrays of semiconductor nanowires show great potential for material-efficient and high-performance solar cells. The characterization and correlation between material structure and properties of the individual nanowires are crucial for the continued performance improvement of such devices. In this work, we use a scanning tunneling microscope (STM) probe inside a scanning electron microscope (SEM) to study single photovoltaic nanowires. The STM probe is used to contact individual nanowires in ensembles.… Show more

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Cited by 4 publications
(5 citation statements)
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“…28,29 By integrating a scanning tunneling microscopy (STM) probe inside an SEM chamber, the effect of mechanical strain on the photocurrent and the electrical properties of single GaA nanowires was investigated. 30,31…”
Section: Sem-based Multi-physical Characterization Systemmentioning
confidence: 99%
See 1 more Smart Citation
“…28,29 By integrating a scanning tunneling microscopy (STM) probe inside an SEM chamber, the effect of mechanical strain on the photocurrent and the electrical properties of single GaA nanowires was investigated. 30,31…”
Section: Sem-based Multi-physical Characterization Systemmentioning
confidence: 99%
“…28,29 By integrating a scanning tunneling microscopy (STM) probe inside an SEM chamber, the effect of mechanical strain on the photocurrent and the electrical properties of single GaA nanowires was investigated. 30,31 In a recent work, 22 we developed the first SEM-based nanomanipulation system (schematically shown in Fig. 1) that integrates the mechanical, electrical, and optical measurement capabilities, for multi-physical characterization of single semiconductor nanowires.…”
Section: Sem-based Multi-physical Characterization Systemmentioning
confidence: 99%
“…The expected doping concentrations by comparison to planar growth are 3.5 × 10 19 and 5 × 10 18 cm −3 for the core and shell, respectively. An STM-SEM setup, described in detail in, 38 was used to electrically contact individual, as-grown nanowires. All experiments were performed in an FEI Versa 3D FIB-SEM.…”
mentioning
confidence: 99%
“…Based on a concept where we have a scanning tunneling microscope (STM) inserted in scanning electron microscopes (SEM) or transmission electron microscope (TEM) holders [1,2], we have developed methods for different types of in situ experiments where we study electric field, light, mechanical strain and temperature induced effects on material structure and properties with high spatial resolution for imaging, diffraction and spectroscopy [3,4]. However, it is crucial to consider and understand the effects of the interaction between the electron beam and the specimen to correctly interpret the results.…”
mentioning
confidence: 99%
“…However, it is crucial to consider and understand the effects of the interaction between the electron beam and the specimen to correctly interpret the results. In this presentation, we will illustrate different manifestations of electron beamsample interaction and also the influence of beam energy and dose on the interaction [3][4][5][6].…”
mentioning
confidence: 99%