An Update on Scanning Force Microscopies

Abstract

Simple, low-maintenance instrumentation can be used to image virtually any material at the microscopic and nanoscopic level Scanning probe microscopies are quickly becoming routine methods in many laboratories. The ability to probe the microscopic and nanoscopic structure of surfaces in a variety of ambient conditions with a lowmaintenance instrument that sits on a benchtop has contributed to the popularity of these techniques. Scanning tunneling microscopy (STM), invented in 1982, was the first technique capable of directly imaging surface atoms in real space (1), Although this instrument has been miniaturized, multiplexed, and adapted to many environments, there have been few major innovations since its invention.The same cannot be said of atomic force microscopy (AFM), invented in 1986 (2). Whereas the scanning tunneling

Atomic force microscopy used for the surface characterization of microcapsule immunoisolation devices

“…A more detailed description of the AFM operation can be found elsewhere. 13,14 Several microcapsules were transferred and attached to a 1-cm 2 newly cleaved mica surface by applying a minimum amount of vacuum grease (Apiezon, UK) between each capsule and the substrate surface. The grease was spotted onto the substrate using a sharp glass capillary.…”

Atomic scale imaging of amorphous silicate glass surfaces by scanning force microscopy

“…A further advantage is the applicability to nonconducting systems [11,12,30], which form the larger part of the class of amorphous materials. Atomic force microscopy, indeed, has been successfully used to study e.g.…”

Working model of an atomic force microscope

“…By studying the physics of an AFM, students can learn the applications of van der Waals forces, optics, Hooke's law, and other essential ideas. 3 There are few educational materials other than diagrams and photographs of an AFM. 4 Several "macroscopes" have been made to accurately model the functions of AFMs, but many of these macromodels focus mainly on testing the accuracy of using microscopic equations in macroscopic applications.…”