Analog Device Design for Testability in the Case of Oscillation Based Testing

Petrovic, Miljan; Milic, Miljana

doi:10.1109/miel.2017.8190122

Cited by 3 publications

(1 citation statement)

References 9 publications

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“…Afterwards, the frequency characteristic is simply observed such as amplitude, a center frequency, and distortion. The oscillator-based BIST for the analog filters is proposed in [9,10], the DC gain, ripple, and the cut-off frequency are measured with high faults coverage. However, the pass/fail decision is based on monitoring and observing technique.…”

Section: Introductionmentioning

confidence: 99%

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

Wannaboon

Jiteurtragool

San-Um

et al. 2018

IEICE Electron. Express

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Detection of parametric faults is a crucial issue due to the large variation of the fabrication process, which provide a range of acceptable parameter deviations in analog circuits. This paper presents a phase difference analysis technique, which is sensitive to the parametric deviations and allows a tolerance band of passive analog components. Test operations can be simply achieved by comparing the phase difference between a reference clock signal and a reconfigured circuit-under-test (CUT) as an oscillator. The difference of phase characteristics between the two signals can be utilized as an indicator for a fault signature, which can be characterized by a compact digital circuit comprising a counter and logic components. Simulation of faults detection reveals a high faults coverage, high-speed testing, and tolerance band controllability. The proposed technique has offered a fully on-chip BIST in 0.18-µm CMOS standard technology with no external test equipment required.

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Section: Introductionmentioning

confidence: 99%

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

Wannaboon

Jiteurtragool

San-Um

et al. 2018

IEICE Electron. Express

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Aircraft System State Recognition and Fault Prediction Based on a Test Diagnostic Model

Chen

et al. 2021

IOP Conf. Ser.: Mater. Sci. Eng.

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The existing testability models for fault prognosis of aircraft systems limit the implementation of prognosis and health management systems. This paper develops a test diagnosis modeling method and relevant algorithms to support dynamic testing and to evaluate fault prognostic ability during aircraft system design. According to the system principles and the complex function structure of aircraft systems, a test diagnostic model is established by integrating testing and prognostic information with a test diagnostic skeleton model using multi-signal flow. New test indexes are identified to assess the testability and prognostic ability of aircraft systems. Relevant state recognition and fault prediction algorithms are established by fusing the improved particle swarm optimization algorithm and Hidden Semi-Markov Model. The feasibility and validity of the test diagnostic modeling method and relevant algorithms are verified in an aircraft’s engine bleed air system. Training and test show that the model can support analysis and estimation, and the algorithms can ensure accurate results after training the HSMM using improved PSO algorithm.

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Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Nel

Dualibe

Stander

2023

IEEE Open J. Circuits Syst.

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Oscillation-based testing (OBT) and Oscillation-based built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue and RF circuits, but both are sensitive to process, voltage and temperature (PVT) variation. This paper investigates 15 OBT and OBIST feature extraction strategies, and four approaches to threshold selection, by calculating figure-of-merit (FoM) across PVT variation. This is done using a 2.4 GHz LNA in 0.35 μm CMOS as DUT. Of the 15 feature extraction approaches, the OBT approaches are found more effective, with some benefit gained from switched-state detection. Of the four approaches to threshold selection (nominal-ranged static thresholds, extreme-range static thresholds, temperature dynamic thresholds, and simple noise-filtered tone detection), dynamic thresholds resulted in the highest average FoM of 0.919, with the best FoM of 0.952, with a corresponding probability of test escape P(TE) and yield loss P(YL) of 5•10 -2 and 1.89•10 -2 respectively but requires accurate temperature measurement. Extreme static threshold selection resulted in a comparable average FoM of 0.912, but with less susceptibility to process variation and without the need for temperature measurement. Binary detection of a noisefiltered oscillating tone is found the least complex approach, with an average FoM of 0.891.

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Analog Device Design for Testability in the Case of Oscillation Based Testing

Cited by 3 publications

References 9 publications

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

Aircraft System State Recognition and Fault Prediction Based on a Test Diagnostic Model

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

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