“…The resulting layout extracted fault list contains several kinds of shorts (inter-node, inter-resistor or shorts affecting multiple nets) and opens. The main advantage of this fault list is that a weighted fault coverage (WFC), taking the fault probability into account, can be computed and difficult to detect faults can be related to certain layout structures 38,39 . To enable fault simulation prior to layout, the re-use of DfT optimised cells and their corresponding layout extracted fault list is a promising compromise.…”