2000
DOI: 10.1007/s11664-000-0242-x
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Analysis of 1/f noise in LWIR HgCdTe photodiodes

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Cited by 23 publications
(8 citation statements)
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“…Dark current and total current (darkþphoto-current) increases exponentially with increasing reverse bias voltage [71]. The cumulative of the fundamental dark current mechanisms does not normally show a complete agreement with the experimental data [63][64][65][66]. Fabrication related parameters like passivation-HgCdTe interface characteristics influence the performance of APD.…”
Section: Trap Assisted Tunneling Currentmentioning
confidence: 93%
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“…Dark current and total current (darkþphoto-current) increases exponentially with increasing reverse bias voltage [71]. The cumulative of the fundamental dark current mechanisms does not normally show a complete agreement with the experimental data [63][64][65][66]. Fabrication related parameters like passivation-HgCdTe interface characteristics influence the performance of APD.…”
Section: Trap Assisted Tunneling Currentmentioning
confidence: 93%
“…Dark current and the noise currents should be minimize to achieve better performance of APD [61][62][63][64][65][66]. The performance of HgCdTe APD has improved in terms of high gain at low reverse bias, low noise, and Fig.…”
Section: Figures Of Meritmentioning
confidence: 99%
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“…It is assumed that in a quite universal way the total 1/f noise p.s.d. can be calculated as the sum of the contributions introduced by each dark current component of the detector (Bae et al 2000;Bajaj 1992). We have recently shown (Ciura et al 2016) that: (i) the diffusion current does not make observable contribution to 1/f noise; (ii) the shunt current I sh , the bulk generation-recombination (g-r) current I gÀr , and the tunneling current I tun (trap-assisted or band-to-band) make significant contributions to 1/f noise.…”
Section: Introductionmentioning
confidence: 99%
“…Intensive research on HgCdTe photodiodes in last 25 years, though, has enhanced our knowledge of 1/f noise to some extent [1][2][3][4][5][6][7][8][9], a clear understanding is however still lacking due to a large scatter in the available database. Most of these studies seek the correlation of 1/f noise with the dark current of the diode.…”
Section: Introductionmentioning
confidence: 99%