Analysis of a novel ellipsometric technique with special advantages for infrared spectroscopy

Spectroscopic ellipsometric investigation of clean and oxygen covered copper single crystal surfaces

“…The rotating analyser is speed-controlled [7] with an accuracy within 5 ppm at an angular frequency of 66.6 Hz. The harmonic detector signal is fed into a filter circuit where two frequencies are separated as described in refs.…”

“…The harmonic detector signal is fed into a filter circuit where two frequencies are separated as described in refs. [7,8]. The ellipsometric parameters A and 4 are calculated from the measured phase angles of the two frequencies.…”

An Investigation of the Techniques of Ellipsometry, Internal Reflection Spectroscopy, and Moment Analysis to the Study of Films and Substrates

“…Stobie el at (Ref. 20) discuss an IR ellipsometer that, in some cases, does not require such critical, absolute intensity measurements. Their ellipsometer has a stationary polarizer and analyzer and a rotating polarizer (Prot) in either P Prot S A or a P S Prot A configuration.…”

Rotating analyzer–fixed analyzer ellipsometer based on null type ellipsometer

“…1 Rotating element type is faster; thus it is more suitable for kinetic measurements, and can operate without a wavelength dependent compensator, which is important for spectroscopic applications. 5,[8][9][10] The conventional null type ellipsometer is still widely used in many laboratories. In this article the conversion of the null polarizer-compensator-sample-analyzer ͑PCSA͒ type ellipsometer into the rotating analyzer-fixed analyzer ͑PCSrotA-A͒ type, without sacrificing the null mode operation, is considered.…”