2016
DOI: 10.1063/1.4942654
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of Cu(In,Ga)Se2 thin-film modules by electro-modulated luminescence

Abstract: Thin-film Cu(In,Ga)Se2 modules are investigated by electro-modulated luminescence with bias illumination. The large signal analysis enables the determination of the average current density/voltage (J/V) characteristics of individual cell-stripes in a module, without contacting each individual cell. It was found that the characteristics determined from electro-modulated photo-luminescence measurements differ from the characteristics determined without bias illumination via electro-luminescence. As a reason for … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
4
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(4 citation statements)
references
References 25 publications
0
4
0
Order By: Relevance
“…The inhomogeneously distributed shunt defects appear as very bright (red‐dashed circles) or dark spots (black‐dashed circles) in both the experimental and the simulated f T images, revealing their individual local responses to terminal differential changes. Note that a similar phenomenon of the increased photocurrent transport efficiency of a shunted cell is observed in the CIGS module, which is the result of the series connection of the cells . Combined with the mathematical relation deduced above, the ohmic and nonohmic shunt defects can thereby be identified from the nonshunted regions.…”
Section: Resultsmentioning
confidence: 55%
“…The inhomogeneously distributed shunt defects appear as very bright (red‐dashed circles) or dark spots (black‐dashed circles) in both the experimental and the simulated f T images, revealing their individual local responses to terminal differential changes. Note that a similar phenomenon of the increased photocurrent transport efficiency of a shunted cell is observed in the CIGS module, which is the result of the series connection of the cells . Combined with the mathematical relation deduced above, the ohmic and nonohmic shunt defects can thereby be identified from the nonshunted regions.…”
Section: Resultsmentioning
confidence: 55%
“…7 This method is universally valid and yields the differential local photocurrent collection efficiency f pc;loc . [8][9][10] Hence, an image of f pc;loc depicts the probability that a locally generated differential photocurrent arrives at the terminals of the solar cell at a given bias situation. Though being simple, general, and quantitative, the method only images a differential and not the integral situation.…”
Section: Imaging Photocurrent Collection Losses In Solar Cellsmentioning
confidence: 99%
“…The details of the measurement and calculation procedure have been published previously. 8,9 For our purpose, we have to calculate the total externally collected photocurrent I coll;loc resulting from the generated photocurrent at position r according to…”
Section: Imaging Photocurrent Collection Losses In Solar Cellsmentioning
confidence: 99%
See 1 more Smart Citation