“…In condition [139], electrochemical impedance spectroscopy (EIS) [139], incidentphoton-to-collected-electron efficiency (IPCE) technique [140], Raman and FTIR spectroscopy [141], spatially-resolved photocurrent [142], intensity modulated photovoltage spectroscopy (IMVS) [143], intensity modulated photocurrent spectroscopy (IMPS) [143], time-resolved transient measurements [144], imaging techniques [145], image processing method [146], and other optical transmittance and reflectance measurements [139], [147]. The ex-situ techniques generally consist of optical and electron microscopic techniques, and include scanning electron microscope (SEM) [148], focused ion beam ( FIB) assisted SEM [149], transmission electron microscope (TEM) [150], energy dispersive X-ray spectroscopy (EDS) [151], electron energy loss spectroscopy (EELS) [152], scanning tunnelling microscopy (STM) [153], atomic force microscopy (AFM) [154], X-ray diffraction (XRD) [155], mass spectroscopy (MS) [156], time of flight-secondary ion mass spectroscopy (TOF-SIMS) [151], [149], nuclear magnetic resonance (NMR) [143], [157], surface photovoltage (SPV) [158], [143], X-ray photoelectron spectroscopy (XPS) [151], [159], photoluminescence (PL) [160], [161], electron beam induced current (EBIC) [74], [162] etc. Some in-situ techniques can be used for studying components of the PSCs such as Raman [163], [164], FTIR…”