2020
DOI: 10.3390/coatings10080780
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Analysis of Metal-Insulator Crossover in Strained SrRuO3 Thin Films by X-ray Photoelectron Spectroscopy

Abstract: The electronic properties of strontium ruthenate SrRuO3 perovskite oxide thin filmsare modified by epitaxial strain, as determined by growing on different substrates by pulsedlaser deposition. Temperature dependence of the transport properties indicates that tensilestrain deformation of the SrRuO3 unit cell reduces the metallicity of the material as well as itsmetal-insulator-transition (MIT) temperature. On the contrary, the shrinkage of the Ru–O–Rubuckling angle due to compressive strain is counterweighted b… Show more

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Cited by 7 publications
(3 citation statements)
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“…By substituting Sr by La in the parent compound LaMnO 3 , the pseudocubic lattice parameter decreases from 0.3944 to 0.3805 nm for LaMnO 3 to SrMnO 3 , respectively. As the films are grown on STO with the cubic lattice constant a = 0.3905 nm, the film experiences higher tensile strain and consequent reduction of the out-of-plane lattice constant “ c ” with an increase in Sr doping. , The estimated Poisson ratio for the films is ∼0.36 ± 0.02, which is a typical value for oxides and manganites. , The RHEED pattern shown in the inset of Figure a with well-defined sharp diffraction streaks corresponds to a long-range crystallinity order of the film.…”
Section: Resultsmentioning
confidence: 99%
“…By substituting Sr by La in the parent compound LaMnO 3 , the pseudocubic lattice parameter decreases from 0.3944 to 0.3805 nm for LaMnO 3 to SrMnO 3 , respectively. As the films are grown on STO with the cubic lattice constant a = 0.3905 nm, the film experiences higher tensile strain and consequent reduction of the out-of-plane lattice constant “ c ” with an increase in Sr doping. , The estimated Poisson ratio for the films is ∼0.36 ± 0.02, which is a typical value for oxides and manganites. , The RHEED pattern shown in the inset of Figure a with well-defined sharp diffraction streaks corresponds to a long-range crystallinity order of the film.…”
Section: Resultsmentioning
confidence: 99%
“…Numerical simulations of the low-angle XRR data (i.e., solid curve in Figure 2b) are performed using the IMD package of the XOP software [32]. XRR oscillations can be seen for 2θ values up to 5 degrees and above it, the oscillations fall below the experimental sensitivity of the x-ray diffractometer [33,34]. The estimated growth rate of the film is ≈0.13 Å per laser pulse.…”
Section: Structural Propertiesmentioning
confidence: 99%
“…[ 11–13 ] Moreover, while recent progresses in the synthesis of rare‐earth scandiate oxide single‐crystals allow the coherent growth of functional perovskites (e.g., ferroelectrics, multiferroics) characterized by large lattice parameters, [ 14 ] the choice of the material for electrodes is mostly confined to the strontium ruthenate SrRuO 3 , whose electrical properties, however, are strongly dependent on substrate induced strain mechanism. [ 15,16 ] On the contrary, the large in‐plane lattice parameters of SNO indicate it as an ideal candidate for multi‐layered epitaxial heterostructures ( Figure ). The electronic band structure of oxygen‐deficient SNO thin films was recently probed by angle‐resolved photoelectron spectroscopy (ARPES).…”
Section: Introductionmentioning
confidence: 99%