“…1͑a͒, we recognize that for these devices, any contributions to ⌬V T from hole trapping is negligible. Further, since activation energies for hole trapping, 9 H and H 2 diffusion, and N IT generation 2,3,6,13 ͑represented by E A͑HT͒ , E A͑H͒ , E A͑H 2 ͒ , E A͑IT͒ , respectively͒ are such that E A͑HT͒ Ӷ E A͑H͒ Ͻ E A͑H 2 ͒ ϳ E A͑IT͒ / n, models involving hole trapping 9 would be inconsistent with temperature-dependent data for these specific experiments.…”