Analysis of the accuracy of the inverse problem solution for a differential heterodyne microscope as applied to rectangular plasmonic waveguides

Akhmedzhanov, I. M.; Baranov, D. V.; Zolotov, Evgenii M

doi:10.1134/s0030400x16060023

Cited by 1 publication

(1 citation statement)

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“…Considering the results reported here, one can surmise that, for any other (particular) metasurface type, the probe beam parameters (their sizes and separation) should be optimized in order to make the metasurface profile retrieval easier and more reliable. However, the proper modeling of the SDHM response and the inverse problem solution [22] would be required to understand the characterization results obtained for metasurfaces with very high phase gradients (and therefore very small cell sizes). In the extreme case of metasurfaces designed for the excitation of surface waves, one can also resort to the metasurface characterization at shorter wavelengths, since it is rather straightforward to simulate the "ideal metasurface" response (with known design parameters) for any wavelength.…”

Section: Discussionmentioning

confidence: 99%

Scanning differential microscopy for characterization of reflecting phase-gradient metasurfaces

Akhmedzhanov

Bozhevolnyi²

2018

Optics Communications

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Gap-plasmon based phase-gradient metasurfaces operating in reflection are widely used for the realization of diverse flat optical components, ranging from spectropolarimeters to efficient couplers for surface waves. Successful implementation of carefully designed metasurfaces is however often hampered by technological imperfections that could be related to deviations of geometrical parameters of fabricated nanostructures from the designed ones or material properties, such as the metal and/or dielectric susceptibilities, from the handbook data. While the overall performance of fabricated components might indicate the existence of a potential problem, it is very difficult to identify its origin, which, for example, can simply be related to the deviation in only one cell of the metasurface supercell. We suggest exploiting well-developed experimental techniques of scanning differential heterodyne microscopy (SDHM) to characterize fabricated phase-gradient metasurfaces designed to operate in reflection. We further establish that, by carefully measuring the SDHM response of a gradient metasurface, one should be able of detecting small (~ 5%) amplitude and phase deviations (with respect to the design values) in the optical field reflected by an individual subwavelength-sized cell of the metasurface supercell. Research highlights Сomplex scanning differential heterodyne microscope (SDHM) response of phase-gradient metasurfaces operating in reflection is numerically investigated, revealing a direct relationship between the SDHM phase response and the average phase gradient of the metasurface. Furthermore, we establish that small (~ 5%) amplitude and phase deviations (from the design values) in the complex reflection of an individual subwavelength-sized cell of the metasurface supercell can be detected by analysing the SDHM response.

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Section: Discussionmentioning

confidence: 99%