2005
DOI: 10.1109/jlt.2005.853147
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Analysis of the tuning sensitivity of silicon-on-insulator optical ring resonators

Abstract: Abstract-High-quality-factor optical ring resonators have recently been fabricated in thin silicon-on-insulator (SOI). Practical applications of such devices will require careful tuning of the precise location of the resonance peaks. In particular, one often wants to maximize the resonance shift due to the presence of an active component and minimize the resonance shift due to temperature changes. This paper presents a semianalytic formalism that allows the prediction of such resonance shifts from the waveguid… Show more

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Cited by 47 publications
(27 citation statements)
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“…Previous studies performed by our group to determine wavelength shift as a function of the change in cladding index have shown a reasonable correlation between theoretically predicted values and experimental results [25]. These studies used index matching fluids to extract a linear relationship between the cladding index change, , to the shift in wavelength position, , where…”
Section: B Optics Designmentioning
confidence: 85%
See 1 more Smart Citation
“…Previous studies performed by our group to determine wavelength shift as a function of the change in cladding index have shown a reasonable correlation between theoretically predicted values and experimental results [25]. These studies used index matching fluids to extract a linear relationship between the cladding index change, , to the shift in wavelength position, , where…”
Section: B Optics Designmentioning
confidence: 85%
“…2). Using equations derived in an earlier publication, the effect of a small regional dielectric change of the upper polymer cladding on the effective index can be calculated [25].…”
Section: B Optics Designmentioning
confidence: 99%
“…There is some loss that such an optical mode will experience even in the absence of any scattering loss or material absorption due to leakage of light into the silicon substrate. This substrate loss can be estimated semianalytically via perturbation, 8 and ranges from approximately −0.15 dB/ cm at 1.49 m to about −0.6 dB/ cm at 1.55 m in this spectral range for our particular SOI wafer geometry.…”
mentioning
confidence: 98%
“…It can be shown [20] that any two modes at a given frequency with differing propagation constants are orthogonal under the metric given in Eq. (6).…”
Section: Theoretical Backgroundmentioning
confidence: 99%