Analysis on NETD of Thermal Infrared Imaging Spectrometer

Zhu, Jian Feng; Zhao, Zhicheng; Shen, Shu Qun; Ding, Shujian; Shen, Weimin

doi:10.1007/978-3-030-27300-2_1

Cited by 2 publications

(2 citation statements)

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“…T mean = R th P mean (3) In fact, the power dissipated in the cable is continuously changing with f = 100 Hz frequency. In order to evaluate temporal variation of temperature, the thermal impedance is required.…”

Section: Theorymentioning

confidence: 99%

“…Nowadays, IR systems based on a single detector, as well as thermal detectors matrix, constantly offer the growing resolution and sensitivity. The NETD of a thermal system allows determining the minimum difference in changes in the temperature value in the area of interest [1,3,4]. Modern solutions and materials used for the construction of IR detectors focus on the implementation of HgCdTe, InSb, PbS CQD and InGaAs technologies, since they increase the possibilities and scope of applications of new IR and NIR (near infrared) devices [6].…”

Section: Introductionmentioning

confidence: 99%

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Measurement of High-Frequency Sub-Noise Temperature Signal and RMS Current Using a Single-Detector High-Speed IR System

Torzyk,

Więcek

2023

PAR

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NETD (Noise Equivalent Temperature Difference) parameter of infrared systems is the important parameter that allows determining the limit of temperature measurement of tested objects. Currently, the commercially available devices have the NETD < 20 mK. The infrared (IR) detectors and accompanying electronic circuits generate noise. In consequence, it is difficult to achieve the high level of signal-to-noise ratio (SNR) while measuring temperature. This paper presents a method of measuring the root mean square (RMS) value of alternating current, using a single-detector high-speed IR system for detecting 100 Hz harmonic spectral component of temperature, whose value is certainly below NETD limit.

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Section: Theorymentioning

confidence: 99%