Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation

Korayem, M. H.; Saraie, Maniya. B.; Saraee, M. B.

doi:10.1016/j.ultramic.2017.01.004

Cited by 5 publications

(4 citation statements)

References 27 publications

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“…In fact, the spring constant (k) can only be recognized as fixed value in a very narrow range of operation. The nonlinear characteristics of the triangular AFM cantilevers has been described earlier by Korayem et al 60 . Computer generated virtual cantilever models confirm the behavior of V-shape probes observed here.…”

Section: Discussionmentioning

confidence: 83%

“…Young's Modulus) and its distribution on the probe are usually undefined, but severely influencing the characteristics of the system. Even the location of the tip on the cantilever (the distance of the tip from the cantilever end) is known to affect the cantilever stiffness 60 . The imprecise attachment of colloidal particle introduces significant contribution to the cantilever stiffness because of the particle mass.…”

Section: Discussionmentioning

confidence: 99%

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Increasing AFM colloidal probe accuracy by optical tweezers

Witko

Baster

Rajfur

et al. 2021

Sci Rep

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A precise determination of the cantilever spring constant is the critical point of all colloidal probe experiments. Existing methods are based on approximations considering only cantilever geometry and do not take into account properties of any object or substance attached to the cantilever. Neglecting the influence of the colloidal sphere on the cantilever characteristics introduces significant uncertainty in a spring constant determination and affects all further considerations. In this work we propose a new method of spring constant calibration for ‘colloidal probe’ type cantilevers based on the direct measurement of force constant. The Optical Tweezers based calibration method will help to increase the accuracy and repeatability of the AFM colloidal probe experiments.

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Section: Discussionmentioning

confidence: 83%

Section: Discussionmentioning

confidence: 99%

Increasing AFM colloidal probe accuracy by optical tweezers

Witko

Baster

Rajfur

et al. 2021

Sci Rep

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show abstract

“…The lateral signal of a position-sensitive detector was acquired with Data Acquisition Card for the tip pushing samples. Moreover, the frictional force between the CNTs and the Si substrate was calculated [24,26,31] to 17 ± 2 nN for the AFM tip pushing distance from 100 nm to 1 um.…”

Section: Afm Experimentsmentioning

confidence: 99%

“…Moreover, scanning-manipulating-scanning reduces efficiency and effectiveness, which hinders AFM tip manipulation [ 20 , 21 ]. Thus, some researchers have developed feedback systems based on the manipulating forces concerning technical difficulties [ 22 , 23 , 24 ], such as the augmented reality system [ 25 , 26 , 27 ], which could monitor real-time changes of the nanoenvironment during the manipulating process by analyzing the interaction forces among the tip, substrate, and manipulating target. Some AFM tip control algorithms and drift-compensation methods were also used to push nanoparticles or nanorods [ 28 , 29 , 30 , 31 , 32 , 33 , 34 ].…”

Section: Introductionmentioning

confidence: 99%

Mechanism-Independent Manipulation of Single-Wall Carbon Nanotubes with Atomic Force Microscopy Tip

Zhang

et al. 2020

Nanomaterials

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Atomic force microscopy (AFM) based nanomanipulation can align the orientation and position of individual carbon nanotubes accurately. However, the flexible deformation during the tip manipulation modifies the original shape of these nanotubes, which could affect its electrical properties and reduce the accuracy of AFM nanomanipulation. Thus, we developed a protocol for searching the synergistic parameter combinations to push single-wall carbon nanotubes (SWCNTs) to maintain their original shape after manipulation as far as possible, without requiring the sample physical properties and the tip-manipulation mechanisms. In the protocol, from a vast search space of manipulating parameters, the differential evolution (DE) algorithm was used to identify the optimal combinations of three parameters rapidly with the DE algorithm and the feedback of the length ratio of SWCNTs before and after manipulation. After optimizing the scale factor F and crossover probability Cr, the values F = 0.4 and Cr = 0.6 were used, and the ratio could reach 0.95 within 5–7 iterations. A parameter region with a higher length ratio was also studied to supply arbitrary pushing parameter combinations for individual manipulation demand. The optimal pushing parameter combination reduces the manipulation trajectory and the tip abrasion, thereby significantly improving the efficiency of tip manipulation for nanowire materials. The protocol for searching the best parameter combinations used in this study can also be extended to manipulate other one-dimensional nanomaterials.

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Frequency-domain analysis method for analyzing and improving the steady-state characteristics of microcantilever in tapping-mode atomic force microscopy

Sun

2018

Eur. Phys. J. Appl. Phys.

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In tapping-mode AFM, the steady-state characteristics of microcantilever are extremely important to determine the AFM performance. Due to the external excitation signal and the tip-sample interactions, the solving process of microcantilever motion equation will become very complicated with the traditional time-domain analysis method. In this paper, we propose the novel frequency-domain analysis method to analyze and improve the steady-state characteristics of microcantilever. Compared with the previous methods, this new method has three prominent advantages. Firstly, the analytical expressions of amplitude and phase of cantilever system can be derived conveniently. Secondly, the stability of the cantilever system can be accurately determined and the stability margin can be obtained quantitatively in terms of the phase margin and the magnitude margin. Thirdly, on this basis, external control mechanism can be devised quickly and easily to guarantee the high stability of the cantilever system. With this novel method, we derive the frequency response curves and discuss the great influence of the intrinsic parameters on the system stability, which provides theoretical guidance for selecting samples to achieve better AFM images in the experiments. Moreover, we introduce a new external series correction method to significantly increase the stability margin. The results indicate that the cantilever system is no longer easily disturbed by external interference signals.

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Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation

Cited by 5 publications

References 27 publications

Increasing AFM colloidal probe accuracy by optical tweezers

Increasing AFM colloidal probe accuracy by optical tweezers

Mechanism-Independent Manipulation of Single-Wall Carbon Nanotubes with Atomic Force Microscopy Tip

Frequency-domain analysis method for analyzing and improving the steady-state characteristics of microcantilever in tapping-mode atomic force microscopy

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