Analytic SEU rate calculation compared to space data

Binder, D.

doi:10.1109/23.25499

Cited by 34 publications

(11 citation statements)

References 6 publications

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“…Using this method, we calculate an upset rate of upset bit day . The second method utilizes the effective-flux model and follows the explanation found in [4]. The model assumes a thin device with an isotropic flux.…”

Section: Prediction Of On-orbit Performancementioning

confidence: 99%

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Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

Hansen

Jobe

Whittington

et al. 2007

IEEE Trans. Nucl. Sci.

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Boeing Satellite Development Center (SDC) geomoblie satellites have experienced a number of very large solar flares during their operational life. Comparison performance in a geostationary orbit to predictions based on heavy-ion ground testing for a digital signal processor (DSP) payload based on 0.25-m CMOS, megagate-ASICs will be presented. Performance during flare peaks will be shown, and comparisons will be made between the response measured during each event, and some commonly used models. The results show that the careful technology selection and SEU mitigation techniques have enabled the spacecraft to operate through several periods of high radiation flux with no ill effects to the system.

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Section: Prediction Of On-orbit Performancementioning

confidence: 99%

“…The method transforms the environmental flux to an effective flux for a specific cutoff angle. The implementation in [4] then calculates the rate as…”

Section: Prediction Of On-orbit Performancementioning

confidence: 99%

Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

Hansen

Jobe

Whittington

et al. 2007

IEEE Trans. Nucl. Sci.

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“…The Impact of HCP In the developed procedure the numerical function-σ ion (L, θ, ϕ) characterizing the sensitivity of VLSIC to SEE occurrence is established based on the experimental data that are obtained at heavy ion accelerators and interpreted using the model of a "thin sensitive layer" [32]. According to this model, function σ ion (L, θ, ϕ) in formula (2) for arbitrary azimuth angle ϕ (asymmetry in azimuth is assumed) is written in the form (4) where L ef = L/cosθ are the effective values of LET, and one-variable function σ (exp) (L ef ) is invariant with respect to any angle of particle incidence onto the VLSIC surface.…”

Section: Cross Section Of Single Event Effectsmentioning

confidence: 99%

The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Кузнецов

2005

Cosmic Res

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Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of highenergy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented. Space vehicles (instrumentation modules) used for studying single event inversions of memory cells of RAM VLSIC SpacecraftCountry of instrumentation design References

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“…2) Effective Flux Model: The original Effective Flux model was introduced by Binder in 1988 [54]. The method is based on consideration of the range of incident angles that can produce an SEU and the ion flux contained in that range.…”

Section: ) Chordlength Modelmentioning

confidence: 99%

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

Reed

Kinnison

Pickel

et al. 2003

IEEE Trans. Nucl. Sci.

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Abstract-Over the past 27 years, or so, increased concern over single-event effects (SEEs) in spacecraft systems has resulted in research, development, and engineering activities centered around a better understanding of the space radiation environment, SEE predictive methods, ground test protocols, and test facility developments. This research has led to fairly well developed methods for assessing the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level. However, as new technology has emerged, these ground test and predictive methods have certain short falls.

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Analytic SEU rate calculation compared to space data

Cited by 34 publications

References 6 publications

Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

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