Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

Brennan, Michael C.; Howard, Marylesa; Marzouk, Youssef; Dresselhaus-Marais, Leora E.

doi:10.48550/arxiv.2203.05671

Cited by 2 publications

(2 citation statements)

References 25 publications

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“…2a, the ∼ 0.015 • misorientation across the boundary, indicating a ∼ 780-nm spacing that makes the dislocations difficult to differentiate based on the thresholds used in our segmentation methods. We note that with higher precision afforded by Bayesian inference, future implementations of this method could improve the resolution significantly [35]. From Fig.…”

Section: Boundary Identificationmentioning

confidence: 93%

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

et al. 2022

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Section: Boundary Identificationmentioning

confidence: 93%

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

et al. 2022

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“…fracture, radiation damage), a crystal grain with sufficiently well-understood defect structures may be measured in real-time, using simulations of all possible defect structures to evaluate the image features appearing in DFXM images collected at only a single crystal orientation. This may be done manually 19 , or using Bayesian inference for physics-informed image interpretation 43 .…”

Section: Analysis For U-hxm Datamentioning

confidence: 99%

Simultaneous Dark- and Bright-Field X-ray Microscopy at X-ray Free Electron Lasers

Howard¹,

Breckling²,

Gonzalez³

2022

Preprint

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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

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Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

Cited by 2 publications

References 25 publications

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

Simultaneous Dark- and Bright-Field X-ray Microscopy at X-ray Free Electron Lasers

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