Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

Yildrim, Can; Poulsen, Henning Friis; Winther, Grethe; Detlefs, C.; Huang, Polly; Dresselhaus-Marais, Leora E.

doi:10.2139/ssrn.4160451

Cited by 5 publications

(7 citation statements)

References 34 publications

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“…Investigating the layers around this layer, we find that the isolated dislocation marked with the red arrow in figure 5(c) extends ≈ 11µm in the volume. Recently, we showed that in annealed single crystals, isolated dislocations can extend tens of micrometers, while the dislocation boundaries can be on the order of hundreds of micrometers [29]. We observe similar isolated dislocations through the volume of the GOI, which gives us ≈ 0.5−1×10 11 m −2 , inline with the literature [30].…”

Section: Microstructure Of the Deformed Statesupporting

confidence: 88%

Exploring 4D microstructural evolution in a heavily deformed ferritic alloy

Yildirim,

Detlefs,

Zelenika

et al. 2023

J. Phys.: Conf. Ser.

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We present a multi-scale study of recrystallization annealing of an 85% cold rolled Fe-3%Si alloy using a combination of dark field X-ray microscopy (DFXM), synchrotron X-ray diffraction (SXRD), and electron backscatter diffraction (EBSD). The intra-granular structure of the as-deformed grain reveals deformation bands separated by ≈ 3–5°misorientation. We monitor the structural evolution of a recrystallized grain embedded in bulk, from the early stages of recrystallization to 65% overall recrystallization through isothermal annealing steps. Results show that the recrystallized grain of interest (GOI) grows much faster than its surroundings yet remains constant in size as the recrystallization proceeds. Isolated dislocations embedded within the volume of the recrystallized GOI are investigated.

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Section: Microstructure Of the Deformed Statesupporting

confidence: 88%

Exploring 4D microstructural evolution in a heavily deformed ferritic alloy

Yildirim,

Detlefs,

Zelenika

et al. 2023

J. Phys.: Conf. Ser.

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“…A spatial 3D map may therefore be acquired by collecting image stacks while stepping the sample along the x axis. We note that the sensitivity of the DFXM microscope requires that the images in such (x, y, z) scans are collected with rotational scans of at least one tilt axis for each plane -to correct for motor drift (> 0.0005 • ) or changes to the microstructure of the sample over the course of the scan 11 . As the reciprocal space resolution function is thinnest in direction φ , it is natural to perform this integration over φ .…”

Section: Overview Of Dfxm Scanning Modalitiesmentioning

confidence: 99%

“…In this section, we provide an overview of the data analysis approach to evaluate the crystalline domains sampled by different scan modalities. For a detailed overview of the analysis, we encourage the reader to explore more thorough guides of specific analysis tools developed in darfix 40 and elsewhere 11 .…”

Section: Analysis For U-hxm Datamentioning

confidence: 99%

“…measuring the orientation of a local domain. When studying the distortion fields surrounding single defects, the average properties are not of interest, and therefore, single images of the weak-beam conditions are preferred 11,16 .…”

Section: Analysis For U-hxm Datamentioning

confidence: 99%

“…Lattice defects are comprised of local disruptions in the crystal packing -either a truncated plane (dislocation), missing or extra atom (vacancy, interstitial), or truncated domain of the crystal (grain boundary). While the cores of defects have Å-nm lengthscales, the long-range distortions from them that span micrometers to millimeters map key interactions that alter the macroscopic properties 5,11,12 . When these defects interact, the velocity of the property-transforming events can span from ballistic dynamics (ps-ns) through cumulative degradation (months to years), spanning >13 decades of timescales.…”

Section: Introductionmentioning

confidence: 99%

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Simultaneous Dark- and Bright-Field X-ray Microscopy at X-ray Free Electron Lasers

Howard¹,

Breckling²,

Gonzalez³

2022

Preprint

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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

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