Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets

Ramezani, Reza; Clemente, Juan Antonio; Franco, Francisco

doi:10.1016/j.ress.2020.107036

Cited by 4 publications

(1 citation statement)

References 31 publications

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“…In addition, accelerated radiation experiments may destroy the chip under test [3]. Mathematical analysis models can help developers estimate the reliability of their designs before running them [4]. Fault injection is an effective method for FPGA testing during running.…”

Section: Introductionmentioning

confidence: 99%

An SEU fault injection platform for radiation-harden design debugging in the FPGA

Zhang¹,

Zhou²,

Wang³

et al. 2022

J. Inst.

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An SEU fault injection platform was designed to ease the debugging of radiation-harden design in FPGA. The platform includes the FPGA being tested, the functional firmware being debugged, the essential-bit extraction algorithm based on Python, and the random fault injection algorithm. The platform can inject single-bit SEU failures, adjacent two-bit SEU failures, and three-bit SEU failures. It works in two modes: normal injection mode and essential-bit injection mode. Functional failure rate is the performance metric which used to evaluate the development. It is the probability of triggering a DUT function failure. In this experiment, the SEU fault injection platform is verified by measuring whether TCP/IP communication links are disconnected due to SEU faults. Experimental results show that the probability of TCP/IP link disconnection in normal injection mode is 0.13%, 0.23% and 0.25% respectively when random injection of single-bit SEU failure, adjacent two-bit SEU failure and multi-bit SEU failure occurs 10,000 times. In the essential-bit injection mode, the probability of TCP/IP link disconnection caused by single-bit SEUs failure, adjacent two-bit SEUs failure and three-bit SEUs failure is 0.87%, 6.97% and 11.76% respectively, indicating a significant increase in the functional failure rates. This shows that the essential-bit injection mode can be used to expose problems more quickly and accelerate the debugging process of FPGA radiation-harden design.

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Section: Introductionmentioning

confidence: 99%