For nearly a decade core-loss elemental mapping by energy-filtered transmission electron microscopy (EFTEM) with ~1 nm resolution has contributed greatly to the understanding of Co(Cr)based thin-film longitudinal magnetic recording media for computer hard disks [e.g. 1-4]. Intergranular layers of non-ferromagnetic Cr-enriched material a few nanometers thick are critical for optimum performance since they decouple the magnetic exchange between grains allowing the magnetization within individual grains to be switched independently, as required for high-density recording of data. Modern perpendicular thin-film recording media, which allow higher recording densities than traditional longitudinal media, have a similar columnar grain structure with nonferromagnetic material separating and decoupling the grains. The present work involves plan-view TEM characterization of back-thinned Co-Pt media (Co/Pt~4) with 6 levels of co-sputtered TiO 2 from 0 to 43 vol% [5,6]. The layer structure of the media was: polished Al substrate/6 nm seed layers/50 nm soft magnetic underlayer/14 nm Ru underlayer/12 nm Co-Pt-TiO 2 /1 nm C overcoat.