Analyzing the Efficiency of Biased-Fault Based Attacks

Abstract

In this paper, we analyze a class of recently proposed fault analysis techniques, which adopt a biased fault model. The purpose of our analysis is to evaluate the relative efficiency of several recently proposed biased-fault attacks. We compare the relative performance of each technique in a common framework, using a common circuit and a common fault injection method. We show that, for an identical circuit and fault injection method (setup time violation through clock glitching), the number of faults per attack greatly varies according to the analysis technique. In particular, DFIA is more efficient than FSA, and FSA is more efficient than both NUEVA and NUFVA. In terms of number of fault injections until full key disclosure, for a typical case, FSA uses 8x more faults than DFIA, and NUEVA uses 33x more faults than DFIA. Hence, the post-processing technique selected in a biased-fault attack has a significant impact on the success of the attack.

DEFAULT: Cipher Level Resistance Against Differential Fault Attack

“…Among the SEA models, one particular model is known as Ineffective Fault Attack (IFA) [19]. Another type of fault attack uses statistical information on the output distribution as it has become biased because of fault injection [34,47]. Such analysis often are based upon hostile fault models like stuck-at, permanent or persistent faults which assume a stronger attacker, specially stuck-at faults which are widely used in the fault analysis literature [22,34].…”

“…Another type of fault attack uses statistical information on the output distribution as it has become biased because of fault injection [34,47]. Such analysis often are based upon hostile fault models like stuck-at, permanent or persistent faults which assume a stronger attacker, specially stuck-at faults which are widely used in the fault analysis literature [22,34]. Stuck-at faults in electronic devices are generally related to defects in devices either at manufacturing or due to high-energy radiation in space electronics.…”