influencing the lifetime of OPVs is the buffer layer located between the cathode and the photoactive layer. Buffer layers are used to confine excitons within the charge generation region, tune the optical field intensity within the active region, protect the active layer from damage during metal cathode deposition, [8] and transport charge to the appropriate electrode. [9,10] Recently, a class of electron-filtering compound buffer layers (EF-CBLs) has been introduced that simultaneously achieve high conductivity and efficient exciton blocking by blending a wide energy gap and electrically insulating exciton blocking molecule with a conductive fullerene. [3,8] These improvements result in high fill factors (FF) and PCE even at light intensities exceeding one sun (1 kW m −2). [8] The impact of such buffers on device operational lifetime has shown promise, [11] but has yet to be explored in conjunction with stable, blended active-layer OPVs. Accelerated aging can provide valuable insights into the processes underlying device degradation. [12-15] The longest-lived OPV cells now take more than a year to degrade to 80% of their initial PCE under one sun illumination, making conventional lifetime testing increasingly impractical. [16-18] In complex OPVs, optimization must occur across a large device architectural and materials space, thereby highlighting the importance of developing accurate methodologies for accelerating and understanding degradation. Exposure to elevated temperature, Electron-filtering compound buffer layers (EF-CBLs) improve charge extraction in organic photovoltaic cells (OPVs) by blending an electronconducting fullerene with a wide energy gap exciton-blocking molecule. It is found that devices with EF-CBLs with high glass transition temperatures and a low crystallization rate produce highly stable morphologies and devices. The most stable OPVs employ 1:1 2,2′,2″-(1,3,5-benzenetriyl tris-[1-phenyl-1H-benzimidazole] TPBi:C 70 buffers that lose <20% of their initial power conversion efficiency of 6.6 ± 0.6% after 2700 h under continuous simulated AM1.5G illumination, and show no significant degradation after 100 days of outdoor aging. When exposed to 100-sun (100 kW m −2) concentrated solar illumination for 5 h, their power conversion efficiencies decrease by <8%. Moreover, it is found that the reliability of the devices employing stable EF-CBLs has either reduced or no dependence on operating temperature up to 130 °C compared with BPhen:C 60 devices whose fill factors show thermally activated degradation. The robustness of TPBi:C 70 devices under extreme aging conditions including outdoor exposure, high temperature, and concentrated illumination is promising for the future of OPV as a stable solar cell technology.