Angular dependent photoelectric yield and optical constants of Al between 40 and 600 eV

Birken, H.-G.; Jark, W.; Kunz, C.; Wolf, R.

doi:10.1016/0168-9002(86)91141-1

Cited by 22 publications

(10 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…2a. We note good agreement between our measurements and those of Henke et al [24], and Birken et al [27], but a clear disagreement with the recently reported measurement of Kettle et al [12], and with the data by Gullikson et al [23] (CXRO) at photon energies below ∼30-40 eV. Our results also appear consistent with the recently reported cold opacity measurements by Williams et al [14] (κ = 2.5 × 10 6 m −1 ), though as the latter measurement was not frequency resolved a more complete comparison is not possible.…”

supporting

confidence: 91%

“…In conclusion, we have presented measurements and calculations of the free-free opacity in Al between the plasma frequency and the L-shell absorption edge. Our experimental data shows good agreement with previous measurements by Henke et al [24] and Birken et al [27], and disagrees with the measurements by Kettle et al [12], and with Gullikson et al [23] at lower photon energies. We find excellent agreement between our measurements and full time-dependent DFT calculations of the free-free opacity.…”

supporting

confidence: 76%

See 1 more Smart Citation

Ab initio simulations and measurements of the free-free opacity in aluminum

et al. 2019

View full text Add to dashboard Cite

The free-free opacity in dense systems is a property that both tests our fundamental understanding of correlated many-body systems, and is needed to understand the radiative properties of high energy-density plasmas. Despite its importance, predictive calculations of the free-free opacity remain challenging even in the condensed matter phase for simple metals. Here we show how the freefree opacity can be modelled at finite-temperatures via time-dependent density functional theory, and illustrate the importance of including local field corrections, core polarization and self-energy corrections. Our calculations for ground-state Al are shown to agree well with experimental opacity measurements performed on the Artemis laser facility across a wide range of x-ray to ultraviolet wavelengths. We extend our calculations across the melt to the warm-dense matter regime, and find good agreement with advanced plasma models based on inverse bremsstrahlung at temperatures above 10 eV.

show abstract

supporting

confidence: 91%

supporting

confidence: 76%

Ab initio simulations and measurements of the free-free opacity in aluminum

et al. 2019

View full text Add to dashboard Cite

show abstract

“…An exponential factor exp[− z / L ] (where L is the effective photoelectron escape depth) can be used20212223 to model propagation of photoelectrons towards the surface of the mirror prior to escape. Taking this factor into account, integration of Eq.…”

Section: Resultsmentioning

confidence: 99%

Surface studies of solids using integral X-ray-induced photoemission yield

Stoupin¹,

Zhernenkov²,

Shi³

2016

Sci Rep

View full text Add to dashboard Cite

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence.

show abstract

“…Photoelectric-yield measurements have been performed with a 770/~thick A1 film on borosilicate glass at 40--600 eV photon energy [5]. Fig.…”

Section: Examplesmentioning

confidence: 99%

“…This method gives excellent results in those cases that have been investigated up to now. In combination with synchrotron radiation, the method was explored thoroughly by Birken et al [5] with AI films evaporated in ultra-high vacuum. In addition, the real part of the index of refraction was obtained.…”

Section: Introduction Imentioning

confidence: 99%