2020
DOI: 10.1038/s41598-020-73030-2
|View full text |Cite
|
Sign up to set email alerts
|

Angular super-resolution retrieval in small-angle X-ray scattering

Abstract: Small-angle X-ray scattering (SAXS) techniques enable convenient nanoscopic characterization for various systems and conditions. Unlike synchrotron-based setups, lab-based SAXS systems intrinsically suffer from lower X-ray flux and limited angular resolution. Here, we develop a two-step retrieval methodology to enhance the angular resolution for given experimental conditions. Using minute hardware additions, we show that translating the X-ray detector in subpixel steps and modifying the incoming beam shape res… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 22 publications
(21 reference statements)
0
1
0
Order By: Relevance
“…In the past two decades, microfocus X-ray scattering techniques, beamlines and experimental equipment have developed rapidly (Yang et al, 2022), primarily benefiting from the high brilliance of third-generation synchrotron radiation sources and efficient focusing optical elements. Micro-scale and nano-scale X-ray beams can be obtained in real space at the sample position (Mino et al, 2018) while ensuring that the smearing effect on the detector plane does not affect the analysis of the scattered signal in reciprocal space (Hua et al, 2017;Gutman et al, 2020). Additionally, the microfocus X-ray scattering technique has received more attention and application (Watanabe et al, 2023;Georgiadis et al, 2021) due to the continuous progress of experimental techniques and structural analysis methods (Liebi et al, 2018;De Falco et al, 2021;Guizar-Sicairos et al, 2020), the development of highspeed algorithms (Gao et al, 2019), and the combination with advanced CT techniques (Hu et al, 2020).…”
Section: Introductionmentioning
confidence: 99%
“…In the past two decades, microfocus X-ray scattering techniques, beamlines and experimental equipment have developed rapidly (Yang et al, 2022), primarily benefiting from the high brilliance of third-generation synchrotron radiation sources and efficient focusing optical elements. Micro-scale and nano-scale X-ray beams can be obtained in real space at the sample position (Mino et al, 2018) while ensuring that the smearing effect on the detector plane does not affect the analysis of the scattered signal in reciprocal space (Hua et al, 2017;Gutman et al, 2020). Additionally, the microfocus X-ray scattering technique has received more attention and application (Watanabe et al, 2023;Georgiadis et al, 2021) due to the continuous progress of experimental techniques and structural analysis methods (Liebi et al, 2018;De Falco et al, 2021;Guizar-Sicairos et al, 2020), the development of highspeed algorithms (Gao et al, 2019), and the combination with advanced CT techniques (Hu et al, 2020).…”
Section: Introductionmentioning
confidence: 99%