“…In the past two decades, microfocus X-ray scattering techniques, beamlines and experimental equipment have developed rapidly (Yang et al, 2022), primarily benefiting from the high brilliance of third-generation synchrotron radiation sources and efficient focusing optical elements. Micro-scale and nano-scale X-ray beams can be obtained in real space at the sample position (Mino et al, 2018) while ensuring that the smearing effect on the detector plane does not affect the analysis of the scattered signal in reciprocal space (Hua et al, 2017;Gutman et al, 2020). Additionally, the microfocus X-ray scattering technique has received more attention and application (Watanabe et al, 2023;Georgiadis et al, 2021) due to the continuous progress of experimental techniques and structural analysis methods (Liebi et al, 2018;De Falco et al, 2021;Guizar-Sicairos et al, 2020), the development of highspeed algorithms (Gao et al, 2019), and the combination with advanced CT techniques (Hu et al, 2020).…”