2010
DOI: 10.1016/j.apsusc.2010.07.097
|View full text |Cite
|
Sign up to set email alerts
|

Anisotropic characteristics of a-plane GaN films grown on γ-LiAlO2 (302) substrates by MOCVD

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2012
2012
2018
2018

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 14 publications
0
1
0
Order By: Relevance
“…On this occasion, the conventional metal-organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE) wherein high growth temperature is adopted (usually higher than 700 1C) is not the optimal approach for epitaxial growth of GaN on these unconventional substrates. The as-grown films grown by those technologies usually show poor quality [19][20][21][22][23]. Apparently, a much lower growth temperature is necessary.…”
Section: Introductionmentioning
confidence: 98%
“…On this occasion, the conventional metal-organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE) wherein high growth temperature is adopted (usually higher than 700 1C) is not the optimal approach for epitaxial growth of GaN on these unconventional substrates. The as-grown films grown by those technologies usually show poor quality [19][20][21][22][23]. Apparently, a much lower growth temperature is necessary.…”
Section: Introductionmentioning
confidence: 98%