2005
DOI: 10.1016/j.cossms.2006.04.003
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Anisotropy in the wet-etching of semiconductors

Abstract: The surface chemistry and electrochemistry of the anisotropic etching of semiconductors are reviewed. Recent insights into the anisotropic chemical etching of silicon in alkaline solution and of electrochemical etching of anisotropic pores in n-type semiconductors are described. The possible role of galvanic effects in open-circuit etching is emphasized.

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Cited by 56 publications
(37 citation statements)
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“…Compared to electrochemical machining (ECM), that also allows the processing of conductive materials regardless of their hardness [119], LCM/E's aspect ratio is much smaller [120] but it has good agreement with better resolution [121] and surface roughness [122]. In comparison to direct laser ablation the MRR and aspect ratio of LCM/E are smaller but it involves little heat generation [123] and thus thermal effects do not occur [124]. Due to the required low laser power density, melting is avoided, resulting in high-precision cutting edges without burrs and debris.…”
Section: Laser Chemical Machining/etching (Lcm/e)mentioning
confidence: 91%
“…Compared to electrochemical machining (ECM), that also allows the processing of conductive materials regardless of their hardness [119], LCM/E's aspect ratio is much smaller [120] but it has good agreement with better resolution [121] and surface roughness [122]. In comparison to direct laser ablation the MRR and aspect ratio of LCM/E are smaller but it involves little heat generation [123] and thus thermal effects do not occur [124]. Due to the required low laser power density, melting is avoided, resulting in high-precision cutting edges without burrs and debris.…”
Section: Laser Chemical Machining/etching (Lcm/e)mentioning
confidence: 91%
“…Moreover, avoiding the chemical etching eliminates the restriction on the cavity designs due the influence of crystal orientation on the chemical etching. 29,30 Furthermore, unlike the slot, the pit is compatible with high index contrast ridge waveguide structures. 31,32 More details about the pit characteristics and features and comparison with a slot can be found in previous work.…”
Section: Laser Design and Fabricationmentioning
confidence: 98%
“…It is commonly accepted that the fast crystallographic growth directions are usually also the fast crystallographic directions for dissolution. 48 According to, 49 these fast growth directions in Zn are <1100>, <1120>, and <0001> in the order of velocity. The schematic outline of the pore body in Zn pores is presented in Fig.…”
Section: J-t Characteristics During Etching and Single Loopmentioning
confidence: 99%